Multi-parameter distributed measurement system and measuring method of dual-core weak grating array based on dark pulse light source
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN UNIV OF TECH
- Publication Date
- 2017-08-11
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Abstract
Description
technical field
[0001] The invention relates to a multi-parameter distributed measurement system, more specifically, relates to a multi-parameter distributed measurement system based on a double-core weak grating array of a dark pulse light source. Background technique
[0002] With the development of science and technology and the improvement of the application requirements of the Internet of Things, the optical fiber sensing network is developing in the direction of large capacity and multi-parameter measurement. The distributed optical fiber sensing network based on Rayleigh scattering, Brillouin scattering and Raman scattering is The measurement of physical parameters such as temperature and strain at various points continuously distributed in space in high voltage, strong magnetic field interference, high current, complex geometric space, flammable, explosive and other harsh environments provides a feasible new method. Distributed optical fiber sensing technology is dev...