Characteristic spectral line rapid selection method used for atomic emission spectroscopy analysis
A technology of atomic emission spectroscopy and characteristic spectral lines, which is applied in the field of rapid selection of characteristic spectral lines in atomic emission spectroscopy analysis, can solve the problems of unsatisfactory spectral line selection, low efficiency, and long time consumption, and achieve a robust and accurate prediction model , Efficiency improvement, performance improvement effect
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[0032] The technical scheme adopted in the present invention is a method for fast selection of characteristic spectral lines for atomic emission spectroscopic analysis, such as figure 1 shown, consists of the following steps:
[0033] Step 1: Perform spectral preprocessing on the original spectral data X, including spectral standardization (spectral line intensity divided by spectral mean intensity) and wavelet threshold denoising (symlet wavelet, decomposition layer number 4, soft threshold) to improve spectral data quality.
[0034] Step 2: Divide all spectral variables X (spectral lines) into several groups X at equal intervals i , for each interval variable (spectral line) X i Perform an interval partial least squares analysis and use the resulting partial least squares weight matrix B for each interval i Calculate the interval correction factor matrix K i , correcting for the variables corresponding to each interval.
[0035] Step 3: Perform overall partial least squ...
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