Characteristic spectral line rapid selection method used for atomic emission spectroscopy analysis

A technology of atomic emission spectroscopy and characteristic spectral lines, which is applied in the field of rapid selection of characteristic spectral lines in atomic emission spectroscopy analysis, can solve the problems of unsatisfactory spectral line selection, low efficiency, and long time consumption, and achieve a robust and accurate prediction model , Efficiency improvement, performance improvement effect

Inactive Publication Date: 2017-09-15
TIANJIN UNIV
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For atomic emission spectroscopy, when applying the multivariate analysis method, it is necessary to select useful characteristic spectral lines from a large number of spectral data to establish a model. It is used for infrared spectrum ana

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Characteristic spectral line rapid selection method used for atomic emission spectroscopy analysis
  • Characteristic spectral line rapid selection method used for atomic emission spectroscopy analysis
  • Characteristic spectral line rapid selection method used for atomic emission spectroscopy analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The technical scheme adopted in the present invention is a method for fast selection of characteristic spectral lines for atomic emission spectroscopic analysis, such as figure 1 shown, consists of the following steps:

[0033] Step 1: Perform spectral preprocessing on the original spectral data X, including spectral standardization (spectral line intensity divided by spectral mean intensity) and wavelet threshold denoising (symlet wavelet, decomposition layer number 4, soft threshold) to improve spectral data quality.

[0034] Step 2: Divide all spectral variables X (spectral lines) into several groups X at equal intervals i , for each interval variable (spectral line) X i Perform an interval partial least squares analysis and use the resulting partial least squares weight matrix B for each interval i Calculate the interval correction factor matrix K i , correcting for the variables corresponding to each interval.

[0035] Step 3: Perform overall partial least squ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the field of spectral analysis, and provides a method for rapidly selecting multiple characteristic spectral lines related with specific element content from a lot of spectrum data, which can greatly increase the selection efficiency, effectively reduces the characteristic spectral line quantity which participates in modeling, simplifies a calculating process, and increases the stability and accuracy of a quantitative prediction model. The rapid selection method comprises the following steps: 1) performing spectrum pretreatment on spectral original data; 2) dividing the all spectral variable spectral lines X into several groups of Xi at intervals; 3) performing integral partial least squares on all variables X' corrected by the step 2); 4) performing partial least squares on the current all variables X'; and 5) comparing the importance of the current variables with threshold one by one; and 6) if quantitative analysis requirement is satisfied, stopping an iteration process, otherwise returning to the step 4). The method is mainly used for spectral analysis occasion.

Description

technical field [0001] The invention belongs to the field of spectroscopic analysis, in particular to a method for quickly selecting characteristic spectral lines for atomic emission spectroscopic analysis. Background technique [0002] Atomic emission spectroscopic analysis is an important application technology of spectral analysis, which can realize the qualitative and quantitative analysis of specific elements or components in the fields of industry, agriculture, and medicine. Typical atomic emission spectroscopy techniques are based on different excitation light sources, such as laser-induced breakdown spectroscopy (LIBS), inductively coupled plasma emission spectroscopy (ICP-AES), spark discharge emission spectroscopy (Spark-AES), etc. Chemistry is a promising and rapidly developing research direction. Emission spectrum analysis is to study the composition and content of substances based on the emission spectrum obtained by the radiative transition of free atoms or ou...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/62
CPCG01N21/62
Inventor 段发阶傅骁蒋佳佳黄婷婷马凌
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap