Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Online non-destructive monitoring method for low-temperature phase changes between tin and alloy of tin

A low-temperature phase transformation and alloy technology, which is applied to the measurement of electrical variables, the preparation of test samples, and measuring devices.

Active Publication Date: 2018-05-25
HARBIN INST OF TECH
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the existing Sn low-temperature phase change detection method must cut and grind the Sn or Sn alloy sample before passing the microscope detection, and provide a continuous on-line non-destructive monitoring of Sn without destroying the sample. A method for low-temperature phase transformation of Sn and its alloys, which can conveniently, accurately and effectively study the process of low-temperature phase transformation of βSn in Sn and its alloys, which is very important for the low-temperature reliability of Sn-based solder

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Online non-destructive monitoring method for low-temperature phase changes between tin and alloy of tin
  • Online non-destructive monitoring method for low-temperature phase changes between tin and alloy of tin
  • Online non-destructive monitoring method for low-temperature phase changes between tin and alloy of tin

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0024] Specific implementation mode 1: This implementation mode records a method for on-line non-destructive monitoring of low-temperature phase transformation of tin and its alloys. The specific steps of the method are as follows:

[0025] Step 1: Draw the research sample into a filament with a diameter of 1~2mm or cold roll it into a thin plate with a thickness of 1~2mm. It should be noted that in order to increase the sensitivity of the sample resistance to the formation of gray tin, the filament The diameter of the thin plate or the thickness of the thin plate should be as small as possible, and the cold working makes the residual stress in the sample, which can promote the low-temperature phase transformation of Sn;

[0026] Step 2: Design the length of the filament or the length and width of the thin plate. It should be noted here that in order to increase the sensitivity of the test, the width of the thin plate should be as small as possible. Cut the sample to be tested...

specific Embodiment approach 2

[0031] Embodiment 2: A method for on-line non-destructive monitoring of low-temperature phase transformation of tin and its alloys described in Embodiment 1. In step 3, there are two types of low-temperature storage, which are as follows: (1) The sample is placed in the same low temperature environment of -200°C~0°C, and the sample to be tested is taken out every other day for circuit measurement, and the curve of current or voltage changes with time is drawn, and then put back into the low temperature environment after measurement. Measure 10 to 20 times; (2) Place the samples to be tested in different low temperature environments between -200°C and 0°C, for example, store the samples to be tested in each low temperature environment at the same interval at 25°C After the time, take a circuit measurement and plot the current or voltage versus temperature.

specific Embodiment approach 3

[0032] Embodiment 3: The method for on-line non-destructive monitoring of low-temperature phase transformation of tin and its alloys described in Embodiment 2, the same time is 10-20 days.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
thicknessaaaaaaaaaa
lengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses an online non-destructive monitoring method for low-temperature phase changes between tin and alloy of tin and belongs to the technical field of low-temperature reliability research of brazing filler metal. The method includes the following steps of pulling a researched testing sample into a thin filament or carrying out cold rolling on the sample to obtain a thin plate; designing other dimension parameters of to-be-detected testing samples, and obtaining the to-be-detected testing samples cut from the thin filament or the thin plate; putting the obtained to-be-detectedtesting samples under the same low-temperature environment or different low-temperature environments for storage, and taking out the to-be-detected testing samples every once in a while to perform current or voltage measurement; erecting a to-be-detected circuit; putting the to-be-detected testing samples into a deionized ice water bath for measurement; drawing a curve graph of the current and voltage changing along with storage time or storage temperature; setting a reference group, preparing same testing samples, carrying out circuit measurement under the same conditions but not performinglow-temperature storage, correspondingly obtaining curves of the current or voltage of the testing samples in the reference group, comparing the curves with the curves of the testing samples subjectedto low-temperature storage, and then completing online non-destructive detection of the low-temperature phase changes between tin and the alloy of tin. The method has the advantages that by utilizingnon-conductivity of Schottky diodes arranged side by side, a low-temperature phase change process can be more accurately monitored under comparison with a resistance measurement mode.

Description

technical field [0001] The invention belongs to the technical field of low-temperature reliability research of solder, and in particular relates to an online non-destructive monitoring method for low-temperature phase transformation of tin and its alloys. Background technique [0002] Tin and its alloys are the main electronic interconnection materials. Although the current soldering solder requires lead-free, the solder joints in electronic devices are mainly made of tin and its alloys, so tin and its alloys are widely used in various external environments. Environmental reliability is very important for the entire electronic device. [0003] For Sn, the allotropic transformation of βSn-αSn will occur at 13ºC; when the temperature is higher than 13ºC, Sn is a body-centered tetragonal white tin structure, showing metallic properties, and when the temperature is lower than 13ºC , Sn becomes the gray tin structure of diamond face-centered cubic crystal system, showing semicon...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/08G01N1/28
CPCG01N1/28G01R27/08
Inventor 王春青籍晓亮安琪赵厢汐
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com