Method for calculating energy spectrum behind charged particle protection layer

A charged particle and protective layer technology, which is applied in the field of calculating the energy spectrum behind the charged particle protective layer, can solve the problems of shortened working life, long calculation time, slow calculation speed, etc., to achieve extended working life, fast calculation speed and easy operation Effect

Active Publication Date: 2018-07-31
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the calculation speed of the energy spectrum is slow and the calculation time is long after the orbital charged particle protective layer exists in

Method used

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  • Method for calculating energy spectrum behind charged particle protection layer
  • Method for calculating energy spectrum behind charged particle protection layer
  • Method for calculating energy spectrum behind charged particle protection layer

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specific Embodiment approach 1

[0029] Specific implementation mode one: the specific process of a method for calculating the energy spectrum behind the protective layer of charged particles in this embodiment is as follows:

[0030] The radiation-sensitive component for spacecraft of the invention is mainly affected by space comprehensive radiation environment factors such as protons, electrons and heavy ions with different energies. The invention is based on the original energy spectrum of original charged particles commonly used in engineering, on the basis of distinguishing positive ions and negative ions, and aiming at different thicknesses of protective layers, the purpose of quickly calculating the energy spectrum after the protective layer is achieved.

[0031] The invention relates to a primary energy spectrum based on orbital primary charged particles commonly used in engineering, and its application objects include materials, devices, electronic systems and structures. The feature of this technolo...

specific Embodiment approach 2

[0049] Embodiment 2: The difference between this embodiment and Embodiment 1 is that the differential energy spectrum of the orbit incident particle is determined in the step 1; the specific process is:

[0050] Determine the satellite orbit height and satellite orbit inclination according to the satellite orbit;

[0051] According to the altitude of the satellite orbit and the inclination of the satellite orbit, the electrons in the Earth's radiation belt, the protons in the Earth's radiation belt, the protons of the solar cosmic ray, the ions of the solar cosmic ray and the ions of the galactic cosmic ray are respectively determined;

[0052] Select the AE8 or AE9 model according to the electrons in the Earth's radiation belt, and obtain the differential energy spectrum f(E′ of the orbital incident electrons 1 );

[0053] Select the AP8 or AP9 model according to the protons in the Earth’s radiation belt, and obtain the differential energy spectrum f(E′ of orbital incident p...

specific Embodiment approach 3

[0059] Specific embodiment three: the difference between this embodiment and specific embodiment one or two is that if the incident particle is an electron in the step four, the range has nothing to do with the thickness of the protective material, and the thickness t of the protective material determined according to the step two is calculated. The differential energy spectrum f(E 1 ') energy E 1 ′ and the range and the thickness of the protective material, the specific formula is:

[0060]

[0061] Among them, R i (E 1 ) is the remaining range of incident electrons in the earth’s radiation belt in the protective material, calculated by software such as EGS and GEANT; R i is the remaining range; E 1 is energy (Earth radiation carries electron energy).

[0062] Other steps and parameters are the same as those in Embodiment 1 or Embodiment 2.

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Abstract

The invention relates to a method for calculating an energy spectrum behind a charged particle protection layer, and aims at solving the problems in the prior art that the calculation speed of an energy spectrum after an orbital charged particle protection layer is slow, the calculation time is long and the spatial particle radiation will cause the shortening of the service life of an electronic device and then cause big loss. The process comprises the steps: determining a differential energy spectrum of orbital incident particles; determining a protection material and the thickness of the protection material; determining the incident angle of the incident particles; calculating the relation between E'1 and the range and thickness of the protection material if the incident particles are electrons; calculating the relation between each of E'2, E'3, E'4 and E'5 and the range and thickness of the protection material if the incident particles are protons or ions; and calculating an unelastic cross section of the incident particles and the protection material; and respectively calculating the differential energy spectrums behind electron, proton and ion protection layers. According to the invention, the method is used in the technical field of spatial environment effects, nuclear sciences, and application technologies.

Description

technical field [0001] The invention relates to a method for calculating the energy spectrum behind a protective layer of charged particles, and belongs to the technical fields of space environment effect, nuclear science and application. Background technique [0002] Spacecraft orbiting in space will be affected by various environmental factors, such as particle radiation, microgravity, and atomic oxygen. With the rapid development of electronic technology, the application of electronic components is becoming more and more extensive. Electronic devices are widely used in satellites, spacecraft and space shuttles to achieve various functions. For electronic devices, particle radiation is the most lethal environmental factor. Early launches of spacecraft failed several times due to damage. With the development of science and technology, although there are fewer and fewer cases of fatal failures in spacecraft such as satellites, they still happen from time to time. Space p...

Claims

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Application Information

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IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 李兴冀杨剑群刘超铭吕钢董尚利
Owner HARBIN INST OF TECH
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