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Method and system for detecting rice on basis of TeraHertz waves

A terahertz and rice technology, which is applied in the field of agricultural product quality inspection, can solve the problems of poor effect of chalky detection method, and achieve the effect of good effect, strong penetrability, and simple operation

Active Publication Date: 2018-08-24
SHENZHEN CCT THZ TECH CO LTD
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Problems solved by technology

[0004] Based on this, it is necessary to provide a method and system for detecting rice based on terahertz waves for the problem that the chalkiness detection method of rice is not effective.

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  • Method and system for detecting rice on basis of TeraHertz waves
  • Method and system for detecting rice on basis of TeraHertz waves
  • Method and system for detecting rice on basis of TeraHertz waves

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Embodiment Construction

[0041] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0042] figure 1 It is a schematic diagram of a terahertz time-domain spectral imaging system according to an embodiment. In this embodiment, a terahertz time-domain spectral imaging system ("system" for short) is used to implement a method for detecting rice based on terahertz waves. Such as figure 1 As shown, the terahertz time-domain spectral imaging system includes a laser, a beam splitter, an optical delay device, a first optical fiber, a second optical fiber, a sample scanning unit (not shown), a sample stage (not shown) and a processor. The sample scanning unit includes a terahertz transmitter and a terahertz receiver.

[0043] The sample to be tested is placed on the sample stage. For example, the samples to be tested can be...

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Abstract

The invention relates to a method and a system for detecting rice on the basis of TeraHertz waves. The method comprises the following steps of using electromagnetic waves in TeraHertz frequency bandsas incident waves to scan a sample to be tested; collecting reflecting waves in TeraHertz frequency bands reflected by the sample to be tested; obtaining a reflection spectrum of the reflecting waves;performing chalkiness region detection on the sample to be detected according to the reflection spectrum. The invention also relates to a system for detecting the rice on the basis of TeraHertz waves. The method and the system for detecting rice on the basis of TeraHertz waves are characterized in that the light intensities of reflecting waves reflected by a chalkiness region and a non-chalkinessregion are different, so that the inside structure of the sample to be tested can be analyzed according to the reflection spectrum obtained by detecting the reflection waves in each position, therefore whether the chalkiness region exists inside the sample to be tested can be judged; the penetration performance of the electromagnetic waves in the TeraHertz frequency band is high; the resolution ratio is high; the operation is simple; no damage is caused on the sample to be tested; the effect for detecting the rice chalkiness structure is good.

Description

technical field [0001] The invention relates to the field of agricultural product quality detection, in particular to a method and system for detecting rice based on terahertz waves. Background technique [0002] Chalkiness is one of the important traits to measure the quality of rice. The chalky area of ​​rice is caused by the insufficient accumulation of endosperm starch and protein granules. The chalky part of rice has low protein content and high starch content. The higher the chalkiness, the worse the quality and nutritional value of the rice, and it is easy to break during processing, which directly affects the appearance quality and commercial circulation of rice. [0003] The chalky areas on the surface of rice are easy to distinguish with the naked eye, but the rice has a certain thickness, and it is difficult to observe the tiny chalky structural areas inside it. Optical microscopes and scanning electron microscopes can only directly observe the structure of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3586G01N21/3563G01N21/55
CPCG01N21/3563G01N21/3586G01N21/55G01N2021/8466
Inventor 李灿沈耀春丁庆李辰
Owner SHENZHEN CCT THZ TECH CO LTD
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