Repair method of single event upset error of SRAM -type FPGA (Field Programmable Gate Array) in-chip tracking loop

Abstract

The invention discloses a repair method of a single event upset error of a SRAM -type FPGA (Field Programmable Gate Array) in-chip tracking loop. Compared with a method for directly performing triple-modular voting on output results of three tracking loops, the problem that after a single tracking loop makes an error, immediate correction cannot be performed, resulting in error accumulation to cause error of the multiple tracking loops, so that the correct results are not outputted is solved, and the errors of the three tracking loops are not accumulated; meanwhile, channel data with errors are synchronously detected and corrected, uninterruptible recovery design of the FPGA tracking loops is realized, and the consistency of the operation states of the three tracking loops is ensured; thesingle event upset error of the tracking loops can be reliably and timely discovered by the triple module redundancy design of the tracking loops and an anti-fuse FPGA triple modular error detection and correction circuit insensitive to the single event upset. The triple modular redundancy and judgement are realized by FPGA software, and compared with a FPGA hard triple module implementation method, a circuit resource can be saved.

Description

technical field [0001] The invention belongs to the technical field of reliability design, and in particular relates to a method for repairing a single-event flipping error of a tracking loop in a SRAM-type FPGA chip. Background technique [0002] In space-based detection, satellite navigation, aerospace measurement and control and other application fields, in order to obtain the required target measurement information, the signal processing system needs to capture and track the received radio signal. SRAM type Field Programmable Gate Array (FPGA) is widely used in the on-chip implementation of complex algorithms for radio signal acquisition and tracking due to its rich resources such as logic gates, multipliers, and memory on-chip. With the improvement of the integration of SRAM FPGA, the single event flipping effect is prone to occur in the space irradiation environment, resulting in circuit function errors and failures, which seriously affect the reliability and safety of...

AI Technical Summary

Problems solved by technology

[0004] The common shortcomings of the above methods are: (1) due to the particularity of the memory function of the on-chip closed-loop tracking circuit, only refreshing the SRAM type FPGA configuration memory cannot realize the repair of the single event flip error of the closed-loop tracking circuit; (2) the SRAM Methods such as reloading a small FPGA can clear the single event flip error of its on-chip closed-loop tracking circuit, but it will interrupt the normal operation of the circuit

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