Automatic test system and method for chip ADC performance

An automated test and chip technology, applied in the field of instruments and meters, can solve the problems of single chip output pin compatibility, high time and cost of debugging instruments, and expensive high-precision instruments, so as to achieve convenient operation, reduce R&D costs and manpower Effect of cost input and measurement accuracy guarantee

Pending Publication Date: 2019-01-04
SHANGHAI HUAHONG INTEGRATED CIRCUIT
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Problems solved by technology

[0003] In order to overcome the single compatibility of chip output pins in the existing ADC performance testing technology, the expansion bottleneck of industrial control software, the high price of high-precision instruments, the high time cost of personnel debugging instruments when facing a large number of sample tests, and the risk of human error, etc. Pr

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  • Automatic test system and method for chip ADC performance
  • Automatic test system and method for chip ADC performance

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Embodiment Construction

[0019] The patent of the present invention will be described in detail below in conjunction with specific software and hardware operation construction as an example.

[0020] figure 1 Including 1. PC terminal, 2. RS232 connection line, 3. Programmable signal source, 4. Clip line, 5. Motherboard to be tested, 6. Programmable logic analyzer, 7. USB connection line, 8. Serial port connection 9. The sub-board to be tested can be plugged and plugged.

[0021] combine figure 1 , figure 2 Shown:

[0022] Step 1: Before the measurement starts, the signal input port of the motherboard 5 to be tested is connected to the signal source 3 using the clamp line 4, and the applicable pluggable sub-board 9 to be tested is selected and directly plugged into the unified pin reserved on the motherboard 5 to be tested , the serial port output end of the motherboard 5 to be tested is connected to the programmable logic analyzer 6 by using the clamp line 4 . The programmable signal source 3 an...

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Abstract

The invention discloses an automatic test system and method for chip ADC performance. The system and method are especially suitable for signal processing hardware such as a Bluetooth chip that requires analog-to-digital conversion, thereby achieving automatic testing of overall ADC performance. The system utilizes an industrial control interface equipped with a standard GPIB, or a programmable signal source and a programmable logic analyzer with standard USB/RS232 serial ports; at the same time, mixed programming is performed through LABVIEW and MATLAB on a PC end; and three data collecting models of instrument acquisition, high compatibility interface acquisition and text input analysis are involved, thereby achieving the automatic testing of the chip ADC performance, and pluggable to-be-tested son-mother boards are utilized to be compatible with output interfaces of different ADCs. The system and method adopt a design idea of combination of automatic software and low-cost and high-compatibility hardware, an operation flow of traditional chip ADC tests is simplified, the efficiency is improved, and the cost and the risk of human errors are reduced.

Description

technical field [0001] The invention relates to an analysis and measurement control technology in the technical field of instruments and meters, in particular to the performance test of an ADC in a chip. Background technique [0002] At present, most of the existing ADC chip tests require large equipment costs or labor costs, and the compatibility of different ADC output pins is relatively single and lacks corresponding scalability, and industrial control software is often limited to instrumentation control. . For a chip, it is generally required that the chip has a unified package to be suitable for the pins of the test board. As for the equipment, in addition to the high price, other relatively low-priced instruments have the bottleneck of single data collection method and inability to be fully automated, which increases the investment in manpower and time costs in platform construction and instrument debugging. At the same time, apart from the instrument factor, the tes...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2834G01R31/2868
Inventor 张瀚文戴昭君段松涛
Owner SHANGHAI HUAHONG INTEGRATED CIRCUIT
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