Automatic test system and method for chip ADC performance

Abstract

The invention discloses an automatic test system and method for chip ADC performance. The system and method are especially suitable for signal processing hardware such as a Bluetooth chip that requires analog-to-digital conversion, thereby achieving automatic testing of overall ADC performance. The system utilizes an industrial control interface equipped with a standard GPIB, or a programmable signal source and a programmable logic analyzer with standard USB / RS232 serial ports; at the same time, mixed programming is performed through LABVIEW and MATLAB on a PC end; and three data collecting models of instrument acquisition, high compatibility interface acquisition and text input analysis are involved, thereby achieving the automatic testing of the chip ADC performance, and pluggable to-be-tested son-mother boards are utilized to be compatible with output interfaces of different ADCs. The system and method adopt a design idea of combination of automatic software and low-cost and high-compatibility hardware, an operation flow of traditional chip ADC tests is simplified, the efficiency is improved, and the cost and the risk of human errors are reduced.

Description

technical field [0001] The invention relates to an analysis and measurement control technology in the technical field of instruments and meters, in particular to the performance test of an ADC in a chip. Background technique [0002] At present, most of the existing ADC chip tests require large equipment costs or labor costs, and the compatibility of different ADC output pins is relatively single and lacks corresponding scalability, and industrial control software is often limited to instrumentation control. . For a chip, it is generally required that the chip has a unified package to be suitable for the pins of the test board. As for the equipment, in addition to the high price, other relatively low-priced instruments have the bottleneck of single data collection method and inability to be fully automated, which increases the investment in manpower and time costs in platform construction and instrument debugging. At the same time, apart from the instrument factor, the tes...

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the single compatibility of chip output pins in the existing ADC performance testing technology, the expansion bottleneck of industrial control software, the high price of high-precision instruments, the high time cost of personnel debugging instruments when facing a large number of sample tests, and the risk of human error, etc. Problem, the present invention provides an automated testing scheme that uses LABVIEW programming as a basis to fuse nested MATLAB algorithms, so that the industrial control software adds the external data analysis algorithm GPADC, and at the same time cooperates with the corresponding highly compatible software and hardware combination of the daughter motherboard

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