A Method for Measuring Post-soldering Alignment Deviation at Key Positions of Optical Interconnection Modules
A technology for interconnecting modules and key positions, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as optical power loss, optical path alignment errors, and affecting the normal operation of optical interconnection systems, so as to reduce random errors, Data is reliable and effective
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[0033] A method for measuring the post-soldering alignment deviation of a key position of an optical interconnection module, specifically comprising the following steps, such as figure 1 Shown:
[0034] 1) Design and make the sample to be tested;
[0035] 2) Offset measurement system design: it consists of Michelson interferometer, He-Ne laser, beam expander, beam splitter, fixed mirror, moving mirror, control panel and base; the moving mirror is installed on the sample to be tested superior;
[0036] 3) Design of temperature detection system: Connect the positive pole of the J-type thermocouple terminal to the CH01-H channel in the 34901A unit module of the Agilent 34970A data scanner, connect the negative pole to the CH01-L channel, put the detection end at the position to be tested, and connect the RS232 data line Connect the computer and the Agilent 34970A data collector, and perform instrument configuration-channel configuration-scanning interval setting-scanning-data arc...
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