Laser-assisted full-reflection X-fluorescence uranium ore trace element analysis device

A laser-assisted and analysis device technology, which is applied in the direction of measurement devices, material analysis using wave/particle radiation, and material analysis, can solve the problems of different measurement accuracy of the area, and achieve effective sample positioning and area, rapid detection, The effect of short measurement times

Active Publication Date: 2019-04-09
EAST CHINA UNIV OF TECH
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  • Abstract
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Problems solved by technology

[0004] The purpose of the present invention is to provide a laser-assisted total reflection X-fluorescence uranium ore trace element analysis device, which adopts total reflection X-ray fluorescence analysis and uses the reflection principle of laser to quickly solve the thickness and area of ​​uranium ore samples in ordinary total reflection X-fluorescence analysis. Measurement accuracy problems caused by different sizes

Method used

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  • Laser-assisted full-reflection X-fluorescence uranium ore trace element analysis device

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Embodiment 1

[0028] 1. The silver target X-ray tube 1 of Dandong Dongfang Electron Tube Factory is used, and the high voltage 6 of the X-ray tube is set to 30,000 volts, which can effectively excite the special X-ray fluorescence of heavy metals in the sample; the angle stage 13 of Japan Sigma Company is used to make the excitation The angle between the X-rays emitted by the light source and the sample surface is 0.15 degrees, the distance between the X-ray tube 1 and the sample surface is 50 mm, and the diameter of the collimator 2 is 2 mm to ensure the best resolution of the heavy metal measuring instrument.

[0029] 2. The angle between the SDD-123 silicon drift detector 3 and the sample surface is 90 degrees and the distance is 15 mm, which is also used to ensure a better resolution of the analyzer.

[0030] 3. The excitation light source, detection device and digital multi-channel spectrometer 10 are fixed in the iron box 5 of 1 mm. The iron box 5 not only plays the role of electric sh...

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Abstract

The invention discloses a laser-assisted full-reflection X-fluorescence uranium ore trace element analysis device. The device comprises an excitation light source, a detection device, a sample table,a laser-assisted analysis device, an analyzer and circuit output equipment. The device disclosed by the invention has the advantages that the sample positioning and area and thickness monitoring can be quickly and effectively realized, the influence on the full-reflection optics by the thickness and area change of the sample can be overcome, and the TXRF measurement accuracy is improved. By adopting the full-reflection X-ray fluorescence analysis principle is adopted, the content of the trace heavy metal in the sample can be quickly detected, the detection is simple and fast and low in cost; the precision is high, the measurement time is short, the personal error is small, and the operator labor intensity is low; the X-fluorescence heavy metal measurement instrument is free from chemical pollution and radioactive pollution, short in measurement time, high in precision, simple in structure, safe and reliable, and convenient for use.

Description

technical field [0001] The invention relates to the field of rapid analysis of elements, in particular to a laser-assisted total reflection X-fluorescence uranium ore trace element analysis device. Background technique [0002] The rapid detection of trace elements in uranium ore has always been a hot spot of concern. [0003] Most of the existing inspection methods are atomic absorption spectrophotometry and atomic fluorescence spectrophotometry, but these methods are complicated to operate, time-consuming, and can only measure one element at a time. Inductively coupled plasma mass spectrometry (ICP-MS) and inductively coupled plasma spectrometry (ICP-AES) have been applied in the analysis of trace heavy metals due to their characteristics of being suitable for multi-element analysis and trace element analysis of uranium ore. Contents of the invention [0004] The purpose of the present invention is to provide a laser-assisted total reflection X-fluorescence uranium ore ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223
CPCG01N23/223Y02E30/30
Inventor 张焱汤彬王仁波张雄杰
Owner EAST CHINA UNIV OF TECH
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