superpixel-based copper surface defect detection method for a flexible IC packaging substrate

A technology for packaging substrates and defect detection, which is applied in the application field of image processing technology, and can solve the problems of high feature dimension, long time consumption, complex algorithm framework, etc.

Active Publication Date: 2019-04-19
SOUTH CHINA UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method makes full use of the information of the image, but usually the feature dimension is high, the amount of calculation is large, the algorithm framework is complex, and it will involve the determination of many parameters, which is not conducive to the promotion and application in the actual production line
The edge detection method generally extracts the edge or contour of the image through an edge detection operator or a specific line transformatio

Method used

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  • superpixel-based copper surface defect detection method for a flexible IC packaging substrate
  • superpixel-based copper surface defect detection method for a flexible IC packaging substrate
  • superpixel-based copper surface defect detection method for a flexible IC packaging substrate

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Embodiment

[0047] This embodiment discloses a method for detecting defects on a copper surface of a flexible IC packaging substrate based on superpixels, such as figure 1 — Figure 5 As shown, the steps are as follows:

[0048] Step S1, first for figure 2 The original image of the flexible IC package substrate shown is filtered and preliminarily thresholded for segmentation, and then the simple linear iterative clustering method (SLIC) is used for superpixel segmentation to obtain a superpixel segmentation map;

[0049] Wherein in this embodiment, the specific process of preprocessing and superpixel segmentation of the flexible IC packaging substrate image in this step is as follows:

[0050] Step S11, first scale the original image according to a certain ratio, adjust the size N uniformly to 514×613, then use a Gaussian filter to eliminate image noise, use a bilateral filter to retain edge information, and reset the gray value to be smaller than the threshold T l0 The gray level of ...

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Abstract

The invention discloses a superpixel-based copper surface defect detection method for a flexible IC packaging substrate, and the method comprises the steps: carrying out the filtering and preliminarythreshold segmentation of an original color image, and obtaining a superpixel segmentation image through employing a simple linear iterative clustering method; Selecting a superpixel of the copper surface area according to the brightness characteristic, extracting the characteristic of the superpixel of the copper surface area by combining the global characteristic of the image, calculating the brightness difference degree of pixel points in the superpixel, finding out a hole in the copper surface, and oxidizing a defect area; Secondly, finding out a superpixel located at the joint of the copper surface and the background according to the gradient and neighborhood information of the pixel, obtaining boundary pixel points located at the edge of the copper surface, obtaining a continuous copper surface line by scanning the neighborhood of the boundary pixel points, and performing feature extraction and analysis on the edge pixel points on the copper surface line to find out the line sawtooth defect. Defects such as holes, oxidation and circuit sawteeth of a copper surface can be accurately positioned.

Description

technical field [0001] The invention relates to the application field of image processing technology, in particular to a method for detecting defects on a copper surface of a superpixel-based flexible IC packaging substrate. Background technique [0002] Flexible IC packaging substrates are generally composed of polyimide, polyester film and other polymer materials, which are light, thin and bendable, and have a wide range of application markets in the circuit board manufacturing industry in the fields of communications, electronics, and aviation. With the development of technology, flexible IC packaging substrates gradually tend to be high-density and high-precision, and the quality requirements are becoming more and more stringent. The manufacturing process integrates knowledge of chemistry, physics, polymers, optics, etc., and the technology is complex. , so it is easy to generate all kinds of quality defects, thereby affecting the quality of the substrate. The manual vi...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/11G06T7/136G01N21/956
CPCG06T7/0004G06T7/11G06T7/136G01N21/956G06T2207/10004G06T2207/30148G06T2207/20192
Inventor 罗家祥周惠芝邹恒
Owner SOUTH CHINA UNIV OF TECH
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