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A method for calibrating the volt-ampere characteristic curve of solar cells

A volt-ampere characteristic curve, solar cell technology, applied in the direction of design optimization/simulation, etc., can solve the problem of high device test current density, and achieve the effect of solving error problems, fast calibration, and theoretical science

Active Publication Date: 2020-07-10
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Then, due to the edge effect of the mask to calibrate the device size, the extra incident light will enter the surface of the device through the aperture edge of the mask at a certain angle, resulting in a high current density of the device test.
The volt-ampere characteristic curve test shows obvious deficiencies under the existing test system

Method used

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  • A method for calibrating the volt-ampere characteristic curve of solar cells
  • A method for calibrating the volt-ampere characteristic curve of solar cells
  • A method for calibrating the volt-ampere characteristic curve of solar cells

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Experimental program
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Effect test

Embodiment 1

[0053] (1) A high-performance printable mesoscopic perovskite solar cell is selected as a test sample, but not limited thereto. The size is 15mm×20mm, and the thickness of the fluorine-doped tin oxide glass substrate is 3mm, but not limited thereto.

[0054] (2) We assemble the device with circular hole shields with different apertures, and the aperture area ranges from 0.031cm 2 increased to 0.503cm 2 , That is, the diameter is from 2mm to 8mm, and the thickness is 1mm, but not limited to this, the volt-ampere characteristic curve is tested in turn, and its photoelectric parameters are recorded.

[0055] (3) if figure 2 As shown in (a), when the circular aperture area is from 0.031cm 2 increased to 0.503cm 2 , the short-circuit current density (J SC ) from 25.28mA cm -2 down to 22.61mA cm -2 , while (PCE) increased from 13.53% to 14.11%, and then dropped to 11.17%. Open circuit voltage (V OC ) increased from 847mV to 911mV, the fill factor (FF) improved from 0.64 to...

Embodiment 2

[0060] Include the following steps in this embodiment:

[0061] (1) With embodiment 1.

[0062] (2) We assemble square hole shields with different apertures on the device, and the aperture area ranges from 0.031cm 2 increased to 0.504cm 2 , That is, the side length is from 1.75mm to 7.1mm, but not limited to this, test its volt-ampere characteristic curve in turn, and record its photoelectric parameters.

[0063] (3) For the results measured using a mask with a square hole, similar values ​​and trends to those of a round hole can be observed. Such as figure 2 shown.

[0064] (4) Count the short-circuit current density value and the reciprocal of the corresponding shield aperture (for square holes, the reciprocal is the reciprocal of the side length 1 / L). Test the resulting short-circuit current density (J SC ) is the dependent variable, and the reciprocal of the side length (1 / L) is the independent variable.

[0065] (5) Use an optional statistical software, such as Or...

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Abstract

The invention discloses a method for calibrating a volt-ampere characteristic curve of a solar cell. The method comprises the following steps: (1) assembling shielding covers with different aperture sizes; (2) testing the volt-ampere characteristic curve of the solar cell, and calculating to obtain a short-circuit current density value by taking the aperture area of the shielding cover as a test area; (3) processing to obtain a plurality of pairs of aperture reciprocal-short-circuit current density values; (4) performing quadratic curve fitting on the multiple pairs of aperture reciprocal-short-circuit current density values to obtain a function relationship, and obtaining a zero-order fitting function constant which is the effective short-circuit current density, thereby obtaining the calibrated short-circuit current density. According to the method, the effective short-circuit current density value can be obtained through calibration by establishing a function relation between the aperture reciprocal and the short-circuit current density value, errors caused by the edge effect of the hole in the shielding cover to the solar cell volt-ampere characteristic curve test are effectively reduced, and therefore the technical problem that the volt-ampere characteristic curve test result is inaccurate is solved.

Description

technical field [0001] The invention belongs to the field of calculation and simulation of solar cell performance, and more specifically relates to a method for calibrating the volt-ampere characteristic curve of a solar cell, and the method is especially useful for calibrating the short-circuit current density in the volt-ampere characteristic curve of a perovskite solar cell. Background technique [0002] In recent years, research on perovskite solar cells has become popular all over the world. At present, the highest cell efficiency certified by authoritative organizations has exceeded 23.3%, surpassing the efficiency of traditional thin-film solar cells, and has become a new star in the photovoltaic industry. Compared with other types of solar cells, this type of battery also has incomparable advantages, such as convenient material sources, simple manufacturing process, low equipment requirements, and low battery cost. These advantages illustrate the potential of perovsk...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20
Inventor 韩宏伟童昌衡荣耀光
Owner HUAZHONG UNIV OF SCI & TECH
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