Method for representing defect of two-dimensional material and application thereof

Abstract

The invention discloses a method for representing a defect of a two-dimensional material and application thereof, and relates to the technical field of defect representation of a nanomaterial. The method for representing the defect comprises the step of: respectively and independently carrying out fluorescence lifetime imaging on a non-defect two-dimensional material substrate sample and a to-be-detected two-dimensional material substrate sample, and according to the change of a fluorescence lifetime, judging whether the to-be-detected two-dimensional material substrate sample has a defect, i.e., if the fluorescence lifetime of the to-be-detected two-dimensional material substrate sample is longer than that of the non-defect two-dimensional material substrate sample, determining that the to-be-detected two-dimensional material substrate sample is a defect sample, and if the fluorescence lifetime of the to-be-detected two-dimensional material substrate sample has no obvious change withrespect to the fluorescence lifetime of the non-defect two-dimensional material substrate sample, determining that the to-be-detected two-dimensional material substrate sample is a non-defect sample.The method disclosed by the invention adopts a fluorescence lifetime imaging method to represent the defect of the two-dimensional material; by the method, the change of the fluorescence lifetime canbe rapidly and visually observed so as to judge whether the material has the defect; and at the room temperature, representation can be carried out, a new defect cannot be introduced, and the method is a non-destructive detection method.

Description

technical field [0001] The invention relates to the technical field of defect characterization of nanomaterials, in particular to a method for characterizing defects in two-dimensional materials and its application. Background technique [0002] Due to their many unique electrical, optical, chemical and thermal properties, two-dimensional materials are widely used, such as playing a very important role in the construction of microelectronic and optoelectronic components, semiconductor devices and solar cells. At the same time, two-dimensional materials are suitable as a carrier for studying the structure and physical properties of materials, and can also be used as the basic structural unit for constructing other dimensional materials, because the study of two-dimensional materials is very important. [0003] However, it is difficult for two-dimensional materials to exist in large quantities in nature. Generally, they are stripped from natural materials by artificial means o...

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Problems solved by technology

[0005] However, these methods have some shortcomings: the electron beam used in the TEM characterization process is relatively high, resulting in new defects, in addition, the characterization area is relatively small, the sample preparation is demanding, the cost is high, and the efficiency is low; the use of Raman to characterize the defect sample For a long time, the laser spot of Raman characterization is on the order of microns, the efficiency is low, and large-area Raman scanning characterization cannot be performed; when using fluorescence spectroscopy to characterize two-dimensional materials, most of them need to be at low temperature (low temperature is sensitive to defects) )conduct

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