Time-to-digital converter adopting dynamic threshold technology

A dynamic threshold and time digital technology, applied in electrical unknown time interval measurement, devices and instruments for measuring time interval, etc., can solve the problems of increased power consumption, a large number of comparators, small measurement range, etc. The effect of improving speed and reliability, avoiding leakage current

Active Publication Date: 2019-06-14
NANJING UNIV OF POSTS & TELECOMM +1
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This structure can achieve very high resolution, but requires a large number of comparators, and its power consumption will increase

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time-to-digital converter adopting dynamic threshold technology
  • Time-to-digital converter adopting dynamic threshold technology
  • Time-to-digital converter adopting dynamic threshold technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] This embodiment provides a time-to-digital converter using dynamic threshold technology, its structure is as follows figure 1As shown, it includes a vernier delay line TDC circuit and an encoder circuit, wherein the vernier delay line TDC circuit judges the time difference between START and STOP signals, and the judgment result is sent to the encoder, and the encoder outputs the corresponding result in binary form.

[0031] The vernier delay line TDC includes three parts: a delay line 1 circuit, a delay line 2 circuit, and a comparator circuit, wherein:

[0032] Delay line 1 is composed of 32 stages of delay buffers with a delay time of Δt1, and delay line 2 is composed of 32 stages of delay buffers with a delay time of Δt2, and Δt1 is greater than Δt2;

[0033] The clock signal START and STOP signals are respectively connected to the input terminals of the first-stage delay buffer of delay line 1 and delay line 2. After the clock signal is delayed by the first-stage de...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a time-to-digital converter adopting a dynamic threshold technology, which is suitable for a near-threshold supply voltage environment and comprises a vernier delay line TDC circuit and an encoder circuit, wherein the vernier delay line TDC circuit judges the time difference of START and STOP signals and outputs corresponding results in a binary form. Due to the fact thatthe lower supply voltage is adopted, the overdrive voltage of the transistor is insufficient, the current of circuit operation can be reduced, and therefore the working time of the vernier delay lineTDC is greatly prolonged. According to the invention, the substrate of the transistor is connected with a gate end by adopting the dynamic threshold technology, so that the potential of the substratecan be changed along with the change of the gate voltage, the threshold voltage of the transistor can be greatly reduced, the source-drain current can be increased, the generation of leakage current can be avoided to the maximum extent, and the speed and the reliability of the circuit are improved.

Description

technical field [0001] The invention relates to a time-to-digital converter, in particular to a time-to-digital converter using dynamic threshold technology, belonging to the technical field of numerical control. Background technique [0002] TDC is widely used in integrated circuits, and is mainly used as a phase detector of an all-digital phase-locked loop. The digital signal output directly reflects the time difference between the rising edges of the two input clock signals, and directly drives the digitally controlled oscillator to make it Its frequency changes. In addition, TDC has a wide range of applications in high-energy physics, laser ranging, medical imaging and other fields. With the rapid development of modern communication technology, WI-FI, Bluetooth, GPS and other modern communication methods have been integrated into people's daily life, and the development of modern communication technology has also promoted the popularization and application of portable d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G04F10/00
Inventor 张聪王子轩夏晓娟吉新村胡善文蔡志匡
Owner NANJING UNIV OF POSTS & TELECOMM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap