Photovoltaic array fault parameter identification method

Abstract

The invention discloses a photovoltaic array fault parameter identification method, which can realize parameter identification of faults such as shadow shielding, bypass diode short circuit, abnormalincrease of equivalent series resistance and the like of a photovoltaic array, and specifically comprises the steps of continuously adjusting to-be-identified parameters of the array simulation modelby utilizing a differential evolution algorithm according to the scanning an array I-V characteristic curve, and enabling I-V curve output by the simulation model to continuously approaches to the actual measurement I-V curve, and finally, minimizing the error between the two curves, so that fault parameters are identified. The precondition of the identification method provided by the invention isthat an array model capable of simulating the three faults at the same time is built. The identification method can identify the fault parameters when a plurality of faults occur at the same time, can obtain the fault degree and other related information through the identified fault parameters, and is suitable for the fields of fault diagnosis, performance evaluation and the like of the photovoltaic array.

Description

technical field [0001] The invention belongs to the technical field of photovoltaic systems, and in particular relates to a photovoltaic array fault parameter identification method. Background technique [0002] Photovoltaic array is an important part of photovoltaic power generation system. Because it works in a relatively harsh environment for a long time, it will cause open circuit, short circuit, hot spot of the array, and inverter overheating under the influence of factors such as heat, electricity and external damage. Current, overvoltage, power tube open circuit and other faults seriously affect the power generation efficiency of the photovoltaic system. In addition, partial shading not only reduces the output power of photovoltaic modules, but also becomes one of the causes of failures such as hot spots. In order to avoid serious accidents caused by faults and improve system power generation efficiency, research institutions and enterprises at home and abroad have l...

AI Technical Summary

Problems solved by technology

There are also many fault diagnosis methods based on machine learning. These methods can effectively judge a variety of fault types, but the prerequisite is to ensure a good training set. Therefore, it is necessary to collect more array I-V curves in the fault state of the target array, which will have a negative impact on the array. In addition, such methods can only give diagnostic results, and cannot further evaluate fault-related parameters.

Images