Substrate Enhanced Comparators and Electronic Devices

Abstract

The present invention provides a substrate-enhanced comparator and electronic equipment. The comparator includes: a cross-coupled latch, which is used to connect the input signal to the gate of the cross-coupled MOS transistor to form the first input of the latch. Terminal; output buffer, connected to the cross-coupled latch, used to amplify the output signal of the latch; AC coupler, connected to the output buffer, used to receive and amplify the output signal of the latch, and couple the output signal To the cross-coupled latch MOS transistor substrate forms the second input end of the latch; the cross-coupled latch is also used to output the input signal sampled at the first input port and the input signal sampled at the second input port regeneration latch. The present invention additionally introduces the substrate input into the cross-coupling structure of the traditional latch as the second input terminal of the latch, which not only introduces the body transconductance of the cross-coupling MOS transistor into the input node, but also enhances the positive feedback capability, Faster latches.

Description

technical field [0001] The invention relates to the technical field of analog-digital hybrid integrated circuits, in particular to a substrate-enhanced comparator and electronic equipment. Background technique [0002] Comparator (Comparator) is an important component module of many integrated circuits (IC), such as analog-to-digital converter (ADC), transconductance amplifier (OTA), voltage reference source (VR) and clock data recovery circuit (CDR), through detection The differential input voltage produces a corresponding output that displays input voltage information with a larger magnitude. In modern communication systems, along with the continuous demand for lighter weight and smaller size of portable devices, there is an urgent need for a low-voltage high-speed comparator structure. [0003] However, with the reduction of advanced CMOS process size (to 40nm and 28nm, even smaller), the power supply voltage of the core circuit is also reduced, but the threshold voltage...

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Problems solved by technology

[0004] In view of the shortcomings of the prior art described above, the object of the present invention is to provide a substrate-enhanced comparator and electronic equipment for solving the problem of latch speed in the prior art due to limited power supply voltage and process characteristic frequency. The limitation of the comparator causes the problem that the comparator cannot achieve high speed under low voltage conditions

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