High-resolution optical imaging method based on nano-particle calibration

Abstract

The invention relates to a high-resolution optical imaging method based on nanoparticle calibration. The high-resolution optical imaging method comprises the following steps: (1) capturing images of asample and an optical imaging system point spread function PSF by using a common wide-field optical microscope; (2) obtaining initial estimation about the image through standard Tikhonov regularization deconvolution; (3) carrying out edge-preserving smoothing filtering on the initial estimation of the image; (4) calculating an adaptive priori regularization item of the image; and (5) obtaining the estimation of the clear image based on the deconvolution adaptive to the sparse prior. According to the method, an ordinary wide-field optical microscope can be used for achieving non-invasion damage, the diffraction limit can be broken through, the high spatial resolution is achieved, the method is simple, the detection time is short, the cost is low, and the quality of the obtained image is high.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a high-resolution optical imaging method based on nanoparticle calibration. Background technique [0002] Accurate and clear images are important for many research and applications. However, the Abbe optical diffraction limit severely limits the imaging resolution. In order to solve such problems, various existing high-resolution microscopic imaging detection technologies improve the resolution from different angles (wavelength, near-field, etc.), such as electron microscopy, near-field scanning optics, etc. Microscopy, etc.; super-resolution fluorescence microscopy even uses information in the time dimension to break the diffraction limit. Although these high-resolution microscopic imaging detection technologies can achieve good spatial resolution, the imaging process is complex, the imaging cost is too high, the detection time is long, and some even cause contaminatio...

AI Technical Summary

Problems solved by technology

However, the Abbe optical diffraction limit severely limits the imaging resolution. In order to solve such problems, various existing high-resolution microscopic imaging detection technologies improve the resolution from different angles (wavelength, near-field, etc.), such as electron microscopy, near-field scanning optics, etc. Microscopy, etc.; super-resolution fluorescence microscopy even uses information in the time dimension to break the diffraction limit

Although these high-resolution microscopic imaging detection technologies can achieve good spatial resolution, the imaging process is complicated, the imaging cost is too high, the detection time is long, and some even cause contamination and damage to the sample.

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