High-resolution optical imaging method based on nano-particle calibration

A nanoparticle and optical imaging technology, applied in the field of image processing, can solve the problems of limited imaging resolution, sample contamination and damage, complex imaging process, etc., and achieve the effect of improving image resolution, improving quality, and simple optical system

CN110111392AActive Publication Date: 2019-08-09HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Publication Date
2019-08-09

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Abstract

The invention relates to a high-resolution optical imaging method based on nanoparticle calibration. The high-resolution optical imaging method comprises the following steps: (1) capturing images of asample and an optical imaging system point spread function PSF by using a common wide-field optical microscope; (2) obtaining initial estimation about the image through standard Tikhonov regularization deconvolution; (3) carrying out edge-preserving smoothing filtering on the initial estimation of the image; (4) calculating an adaptive priori regularization item of the image; and (5) obtaining the estimation of the clear image based on the deconvolution adaptive to the sparse prior. According to the method, an ordinary wide-field optical microscope can be used for achieving non-invasion damage, the diffraction limit can be broken through, the high spatial resolution is achieved, the method is simple, the detection time is short, the cost is low, and the quality of the obtained image is high.
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Description

technical field

[0001] The invention relates to the technical field of image processing, in particular to a high-resolution optical imaging method based on nanoparticle calibration. Background technique

[0002] Accurate and clear images are important for many research and applications. However, the Abbe optical diffraction limit severely limits the imaging resolution. In order to solve such problems, various existing high-resolution microscopic imaging detection technologies improve the resolution from different angles (wavelength, near-field, etc.), such as electron microscopy, near-field scanning optics, etc. Microscopy, etc.; super-resolution fluorescence microscopy even uses information in the time dimension to break the diffraction limit. Although these high-resolution microscopic imaging detection technologies can achieve good spatial resolution, the imaging process is complex, the imaging cost is too high, the detection time is long, and some even cause contaminatio...

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Embodiment Construction

[0039] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0040] The technical principle of the present invention is: use gold nanoparticles as a very small physical point source to obtain the point spread function under the same imaging conditions, and also use nanoparticles to calibrate the point spread function (PSF) of the optical imaging system. The field microscope performs dark-field imaging on gold nanoparticles, and then performs Gaussian fitting. After background removal and normalization, the sample image is restored using a non-blind deconvolution algorithm.

[0041] The technical principle route of the present invention is:

[0042] First of all, the present invention first analyzes the reason and feasibility of using the dark field image of gold nanoparticles as the system PSF, that is, the point spread function PSF describes the response of the imaging system to an ideal point source, a...