Large-aperture off-axis reflection type quantitative consistency test and calibration device for multiple optical axes

An off-axis reflection and calibration device technology, which is used in measurement devices, optical instrument testing, and optical performance testing. High precision and practical effect

Pending Publication Date: 2019-08-20
四川长九光电科技有限责任公司
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Problems solved by technology

[0004] Aiming at the defects of commonly used optical axis consistency test methods, the purpose of the present invention is to provide a large-diameter off-axis reflective multi-optical axis consistency quantitative test and calibration device, which adopts a large-

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  • Large-aperture off-axis reflection type quantitative consistency test and calibration device for multiple optical axes
  • Large-aperture off-axis reflection type quantitative consistency test and calibration device for multiple optical axes
  • Large-aperture off-axis reflection type quantitative consistency test and calibration device for multiple optical axes

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[0028] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings, but the protection scope of the present invention is not limited to the following.

[0029] Such as figure 1 with figure 2 As shown, a large-aperture off-axis reflection type multi-optical axis consistency quantitative test and calibration device includes a large-aperture off-axis reflection type collimator assembly 100, a CCD camera 200, an image acquisition and processing assembly 300, and a three-dimensional adjustment platform 400;

[0030] The CCD camera 200 is arranged on the focal plane of the CCD camera branch formed by the beam splitter in the large-aperture off-axis reflective collimator assembly 100, and the center of the sensitive surface of the CCD camera 200 is aligned with the main optical axis of the CCD camera branch. The image acquisition and processing component 300 and the CCD camera 200 are connected by a cable;

[0031] ...

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Abstract

The invention discloses a large-aperture off-axis reflection type quantitative consistency test and calibration device for multiple optical axes. The device comprises a large-aperture off-axis reflection type parallel light tube assembly, a CCD camera, an image collection processing assembly and a three-dimensional (3D) adjusting platform; the large-aperture off-axis reflection type parallel lighttube assembly, the CCD camera and the image collection processing assembly are mounted on the 3D adjusting platform; the large-aperture off-axis reflection type parallel light tube assembly comprisesa multispectral light source, a cross target, a spectroscope, a secondary reflector, a primary reflector, an attenuation sheet and a planar mirror for autocollimation; and the spectroscope is arranged between the secondary reflector and the cross target, the multispectral light source is arranged in front of the cross target, the CCD camera is arranged beside the spectroscope, the primary reflector cooperates with the secondary reflector, and the planar mirror for autocollimation is arranged in front of the primary reflector. The device can be widely applied to consistency detection and calibration of multiple optical axes of multiband photoelectric devices in different platforms.

Description

technical field [0001] The invention relates to the technical field of optoelectronic equipment detection, more specifically, to a large-diameter off-axis reflective multi-optical axis consistency quantitative test and calibration device, which is suitable for the optical axis consistency quantitative test and calibration of multi-spectrum optoelectronic equipment . Background technique [0002] Optoelectronic equipment has obvious advantages in night vision, high-precision tracking and anti-stealth, and has become a focus of high-tech military and civilian equipment development. Optoelectronic equipment is often equipped with photoelectric sensors such as visible light imaging devices, laser rangefinders, mid-wave infrared thermal imaging cameras, and long-wave infrared thermal imaging cameras. They cover a wide band and have multiple optical axes such as visible light, laser, mid-wave infrared, and long-wave infrared. The consistency between optical axes is a key technica...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/0207
Inventor 贺祥清廖小军戴全胜段媛马霞
Owner 四川长九光电科技有限责任公司
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