Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor device and manufacturing method therefor, and power conversion device

A manufacturing method and semiconductor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, output power conversion devices, etc., can solve problems such as position deviation, achieve narrow configuration range, and suppress the decline in heat dissipation

Pending Publication Date: 2019-11-12
MITSUBISHI ELECTRIC CORP
View PDF10 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] On the other hand, as described above, in the power module, there is a possibility that positional deviation may occur between the components that are joined to each other.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device and manufacturing method therefor, and power conversion device
  • Semiconductor device and manufacturing method therefor, and power conversion device
  • Semiconductor device and manufacturing method therefor, and power conversion device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0045] First, use Figure 1 to Figure 5 , a method of manufacturing a power module as a semiconductor device according to a first example of the present embodiment will be described. refer to figure 1 , in the method of manufacturing a power module according to the first example of the present embodiment, first, an insulating substrate 1 is prepared as a substrate. The insulating substrate 1 has, for example, a rectangular shape in plan view, but is not limited thereto, and may have other planar shapes such as a circle or an ellipse, for example. The insulating substrate 1 has a surface 1A and a back surface 1B opposite thereto. Here, as an example, it is assumed that the insulating substrate 1 has a square shape with dimensions of 100 mm×100 mm in plan view. In addition, although the insulating substrate 1 is not shown in the figure, it has, for example, an aluminum layer with a thickness of 0.3 mm, an aluminum nitride layer with a thickness of 0.6 mm, and an aluminum laye...

Embodiment approach 2

[0115] First, use Figure 9 ~ Figure 11 , the method of manufacturing the power module of the present embodiment will be described. The manufacturing method of the power module in this embodiment is basically the same as Figure 1 to Figure 5 The method of manufacturing the power module in Embodiment 1 is the same as that of Embodiment 1, and therefore descriptions of the same steps are omitted. In addition, below, the same code|symbol is attached|subjected to the same component as Embodiment 1, and the description is not repeated.

[0116] refer to Figure 9 , in this embodiment, after passing figure 2 After the semiconductor chip 5 on which the upper surface electrode 6 is formed is placed in the step of 20, the surfaces 5A, 6A of the semiconductor chip 5 and the upper surface electrode 6 are pressed (pressed) from above to below by the pressurizing jig 14 . Figure 10 was carried out Figure 9 The scheme after the pressing process. refer to Figure 11 , and further,...

Embodiment approach 3

[0125] First, use Figure 14 ~ Figure 19 , the method of manufacturing the power module of the present embodiment will be described. The manufacturing method of the power module in this embodiment is basically the same as Figure 1 to Figure 5 The method of manufacturing the power module in Embodiment 1 is the same as that of Embodiment 1, and therefore descriptions of the same steps are omitted. In the following, the same reference numerals are assigned to the same components as those in Embodiment 1, and the description thereof will not be repeated.

[0126] refer to Figure 14 , in this embodiment, also with figure 1 In the same manner as above, the wire protrusions 2 are placed on the surface 1A of the insulating substrate 1, and the first temporary fixing parts 3 are provided at four places so as to form a rectangle or a square surrounded by the outside when viewed from above in the direction of the arrangement. . However, in this embodiment, compared with Embodiment...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Diameteraaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

In a method for manufacturing a semiconductor device (101), a plurality of first temporary fixture parts (3) are supplied onto the surface of a substrate (1) to be scattered at intervals. A first solder layer (4), which is processed into a plate shape and is to become a first solder joint, is placed so as to be in contact with upper portions of the plurality of first temporary fixture parts (3). Asemiconductor chip (5) is placed on the first solder layer (4). Further thereon, a wiring member (9) having a flat plate shape is placed via second temporary fixture parts (7) and a second solder layer (8). In a reflow step, the substrate (1), the semiconductor chip (5), and the wiring member (9) are joined to one another by means of solder.

Description

technical field [0001] The present invention relates to a semiconductor device, a method for manufacturing the same, and a power conversion device, and more particularly, to a power module having a structure in which a flat-plate wiring member is soldered to a semiconductor chip, a method for manufacturing the same, and a power conversion device using the semiconductor device. Background technique [0002] In the power module, the wiring above the semiconductor chip is changed from a bonding wire to a flat-plate wiring member, thereby enabling higher energy density. This is because the cross-sectional area of ​​the flat wiring member intersecting the current path is larger than that of the bonding wire, so the amount of current flowing through the wiring member can be greatly increased. As an example of such a power module, Japanese Unexamined Patent Application Publication No. 2014-43382 (Patent Document 1) discloses a structure in which a substrate is bonded to a semicondu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/60H01L21/52H01L21/56H01L23/48H01L25/07H01L25/18H02M7/48
CPCH01L2224/8314H01L2224/92247H01L21/52H01L21/56H01L23/48H01L25/07H01L25/18H01L2224/48091H01L2224/73221H01L2224/73265H02M7/53871H02M7/003H01L23/057H01L23/24H01L2224/81192H01L2224/83192H01L2224/9221H01L2224/40993H01L2224/40225H01L2224/26165H01L2224/26135H01L24/32H01L24/29H01L24/83H01L24/84H01L24/92H01L2224/83986H01L2224/84986H02P27/08H01L2224/32245H01L2224/32225H01L2224/40491H01L2924/00014H01L2224/83H01L2224/84H01L23/053H01L24/33H01L24/73H01L2224/26145H01L2224/26175H01L2224/29139H01L2224/33179H01L2224/33181H01L2224/33505H01L2224/73215H01L2224/83007H01L2224/83193H01L2224/83815H01L2224/8384H01L2224/83905
Inventor 小川翔平藤野纯司大岛功石川悟重本拓巳
Owner MITSUBISHI ELECTRIC CORP