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A kind of preparation method of powder particle transmission electron microscope sample

An electron microscope, powder particle technology, applied in the preparation of test samples, material analysis using wave/particle radiation, sampling, etc. Simple, low production cost effect

Active Publication Date: 2021-11-09
XIAN TECH UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention provides a preparation method of a powder particle transmission electron microscope sample to overcome the problems of complex process, many influencing factors and high cost in the prior art

Method used

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  • A kind of preparation method of powder particle transmission electron microscope sample
  • A kind of preparation method of powder particle transmission electron microscope sample
  • A kind of preparation method of powder particle transmission electron microscope sample

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] A method for preparing a powder particle transmission electron microscope sample, comprising the following specific steps:

[0028] 1) According to the particle size of the powder particles, select a copper foam structure with an average pore size slightly larger than the average particle size (Note: During TEM observation, magnetic samples will cause electron beam scattering, which will make the clarity of TEM photos worse ), the thickness of the foam net is 1mm, and the foam net with an area of ​​5×5mm (at least one TEM sample of φ3mm can be obtained after post-processing) is used for later use;

[0029] 2) Use a cotton swab to stick a small amount of sample powder and sprinkle it evenly on the foam net. The thickness of the powder layer is 1 / 4 of the thickness of the foam net;

[0030] 3) Put the foam net containing a small amount of sample powder on the platform, tap the platform, and master the tapping force so that the powder particles gradually leak into the hole...

Embodiment 2

[0036] A method for preparing a powder particle transmission electron microscope sample, comprising the following specific steps:

[0037] 1) According to the particle size of the powder particles, select a copper foam structure with an average pore size slightly larger than the average particle size (Note: During TEM observation, magnetic samples will cause electron beam scattering, which will make the clarity of TEM photos worse ), the thickness of the foam net is 0.5mm, and the foam net with an area of ​​5×5mm is cut for use;

[0038] 2) Use a cotton swab to stick a small amount of sample powder and sprinkle it evenly on the foam net. The thickness of the powder layer is 1 / 4 of the thickness of the foam net;

[0039] 3) Put the foam net containing a small amount of sample powder on the platform, tap the platform, and master the tapping force so that the powder particles gradually leak into the holes of the foam net, and prevent the powder from spilling out of the foam net. ...

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Abstract

The invention belongs to the technical field of transmission electron microscope (TEM) sample preparation, and in particular relates to a preparation method of a powder particle transmission electron microscope sample. The present invention provides a method for preparing a powder particle transmission electron microscope sample, so as to overcome the problems in the prior art that the process is complicated, the thin area of ​​the prepared TEM sample is small, and the sample preparation cost is high. In order to achieve the above object, the solution provided by the present invention is to obtain a TEM sample with more thin regions by embedding powder particles in a non-magnetic support foam structure and ion thinning. The method is simple and easy, low in cost, and can obtain TEM powder samples with more thin areas. The present invention is applicable to various conventional particles, and the particle size is submicron, micron or submillimeter; meanwhile, the present invention has versatility and is not only suitable for metal particles, but also non-metallic particles.

Description

Technical field: [0001] The invention belongs to the technical field of transmission electron microscope (TEM) sample preparation, and in particular relates to a preparation method of a powder particle transmission electron microscope sample. Background technique: [0002] Transmission electron microscopy is widely used in materials science and engineering and other related scientific research, and TEM sample preparation plays a very important technical support role in electron microscopy research. Because electrons are easy to scatter or be absorbed by objects, they have the characteristics of low penetration when passing through the TEM sample, so the thickness of the sample will significantly affect the imaging quality of the TEM sample. In order to obtain a satisfactory TEM observation effect, a good thin film sample must be prepared first. Therefore, obtaining an ultra-thin region with a large area (the thickness of the thin region is less than 100nm) on the TEM sample...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q30/20G01N23/04G01N23/041G01N23/2005G01N1/28
CPCG01N1/286G01N23/04G01N23/2005G01N2223/03G01N2223/056G01N2223/102G01N2223/312G01N2223/62G01N2223/635G01N23/041G01N1/32G01N23/2202G01N23/2251G01N2001/045G01N2001/2866
Inventor 孙崇锋席生岐李建平郭永春杨忠朱蕊花白亚平高圆
Owner XIAN TECH UNIV
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