Method for reducing surface pollution generated when ion beams polish optical element
A technology for optical components and surface contamination, applied in optical surface grinders, grinding/polishing equipment, grinders, etc., can solve the problems of reduced transmittance, optical component pollution, black impurities, etc., to reduce impurity elements and improve processing. Quality, effect of improving cleanliness
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[0026] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0027] Such as Figure 1 to Figure 3 As shown, in the embodiment of the present invention, the optical element is placed in the ion beam polishing equipment and the optical element is subjected to ion beam polishing, the optical element after ion beam polishing is taken out from the vacuum chamber, and the sample with black impurities on the surface after contamination figure 1 shown.
[0028] The X-ray diffractometer (XRD) analysis method is used to detect and analyze the black impurity area on the surface of the optical element polished by the ion beam polishing equipment, so as to determine the source of the impurity element; figure 2 It is the microscopic surface of optical components, and its composition is as follows image 3 As shown, according to the analysis of the curve measured by XRD, it ca...
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