Method for testing storage performance of NVRAM

Abstract

The invention belongs to the technical field of electronics. The invention relates to a method for comprehensively testing the storage performance of an NVRAM (Non-Volatile Random Access Memory). By adopting the technical scheme of specific constant value detection, variable value detection and offline and environment simulation detection, rapid, accurate and comprehensive fault diagnosis can be realized, and the reliability, accuracy and comprehensiveness of NVRAM storage performance testing are effectively improved. Hardware resources required by the test method are a self-made test device and a tested object NVRAM, and required software is a self-written test program solidified in a memory of the self-test device. After the testing device is powered on and started, the performance of the testing device can be diagnosed, after it is confirmed that the performance of the testing device is normal, on-line constant value, on-line variable value and off-network storage performance testing operation is conducted on the Nvram, and a testing result is fed back. The problems of incompleteness and incapability of detecting boundaries of the conventional test are solved, and the complete test of NVRAM full-storage space and online and offline synchronous detection is realized. The testing method has the advantages of being low in cost, high in reliability and easy to implement.

Description

technical field [0001] The invention belongs to the field of electronic technology and relates to a comprehensive testing method for storage performance of NVRAM (non-volatile random access memory). Background technique [0002] NVRAM (Non-Volatile Random Access Memory) refers to those semiconductor memories that retain data even when power is turned off. NVRAM is one of the most important storage devices at present and even in the future because the current and future non-volatile memories have good or even very good random addressing capabilities. With the rapid development of mobile devices, portable devices and wireless devices , NVRAM also encountered an unprecedented good time and developed rapidly. NVRAM has the physical advantages of DRAM and SRAM, fast transmission speed, large single-chip capacity, and long-term storage characteristics of hard disks, so it is widely used in automotive systems, communication systems, computer systems, industrial systems, etc. [0...

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the existing test method cannot identify the storage function failure of some NVRAM storage units, it also cannot effectively detect the data loss function after the device is powered off due to the failure of the built-in battery, which leads to misjudgment of the device detection and affects the troops. For the technical problem of normal training, the present invention proposes a comprehensive testing method for the storage performance of NVRAM (Non-Volatile Random Access Memory), which solves the above technical problem, can realize fast, accurate and comprehensive fault diagnosis, and effectively improve Improve the reliability, accuracy and comprehensiveness of NVRAM storage performance testing

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