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Process control test method and system, readable storage medium and electronic equipment

A technology of process control and test method, which is applied in the direction of faulty hardware test method, measurement of electricity, measurement of electrical variables, etc., can solve problems such as inflexibility and long test time, so as to improve production capacity, save pressure test time, facilitate follow-up tests and The effect of shipment

Pending Publication Date: 2020-03-27
INVENTEC PUDONG TECH CORPOARTION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a test method, system, readable storage medium and electronic equipment for process control, which are used to solve the problem that the prior art is based on the test tool in the server test process. Step by step, and this kind of test will be constrained by the test tool, resulting in the problem of long test time and inflexibility

Method used

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  • Process control test method and system, readable storage medium and electronic equipment
  • Process control test method and system, readable storage medium and electronic equipment
  • Process control test method and system, readable storage medium and electronic equipment

Examples

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Embodiment 1

[0029] This embodiment provides a test method for process control, which is adapted to an electronic device, and the electronic device is configured with a first test platform for serial testing and a second test platform for parallel testing; the test method for process control include:

[0030] After entering the test process, judge whether it is necessary to switch to the second test platform according to the test parameters in the preset test tool; if so, switch to the second test platform to call the second test platform and the The first test platform executes the parallel test; after the test is finished, collects the flag file including the test result; if not, only calls the first test platform to execute the serial test.

[0031] The process control testing method provided by this embodiment will be described in detail below with reference to the illustrations. The test method of process control described in this embodiment is used for testing electronic equipment, ...

Embodiment 2

[0081] This embodiment provides a test system for process control, which is adapted to an electronic device, and the electronic device is configured with a first test platform for serial testing and a second test platform for parallel testing; the test system for process control include:

[0082] The judging module is used to judge whether it is necessary to switch to the second test platform according to the test parameters in the preset test tool after entering the test process; if so, switch to the second test platform through a calling module to call the Described second test platform and described first test platform execute parallel test; Wait for test to finish, collect the sign file that comprises test result by a collection module; If not, call described first test platform by described calling module and execute serial test.

[0083] The test system for process control described in this embodiment will be described in detail below with reference to figures. The pro...

Embodiment 3

[0095] This embodiment provides an electronic device, please refer to Figure 4 , shown as a schematic diagram of the hardware structure of the electronic device. like Figure 4 As shown, the electronic device 4 includes: a processor 41, a memory 42, a transceiver 43, a communication interface 44 or / and a system bus 45; the memory 42 and the communication interface 44 are connected to the processor 41 and the transceiver 43 through the system bus 45 And to complete mutual communication, the memory 42 is used to store computer programs, the communication interface 44 is used to communicate with other devices, the processor 41 and the transceiver 43 are used to run the computer programs, so that the electronic device 4 executes the computer program as described in the first embodiment. The individual steps of the test method for process control.

[0096] The system bus mentioned above may be a Peripheral Component Interconnect (PCI for short) bus or an Extended Industry Standa...

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Abstract

The invention provides a process control test method and system, a readable storage medium and electronic equipment, the process control test method is suitable for the electronic equipment, and the electronic equipment is configured with a first test platform used for serial test and a second test platform used for parallel test; the flow control test method comprises the following steps: after entering a test flow, judging whether to switch to a second test platform or not according to test parameters in a preset test tool; if yes, switching to a second test platform to call the second testplatform and the first test platform to execute a parallel test; after the test is finished, collecting a mark file comprising a test result; and if not, only calling the first test platform to execute the serial test. According to the invention, the test process is matched with the test tool, the test tool is flexibly controlled to be parallel, the pressure test time of the test tool is greatly saved, and the productivity is improved; and problems of the to-be-tested equipment can be found in advance, so that subsequent testing and shipment are facilitated through timely correction.

Description

technical field [0001] The invention belongs to the technical field of server testing, and relates to a testing method and system, in particular to a process control testing method, system, readable storage medium and electronic equipment. Background technique [0002] In the current production line-to-server test process, the test process is carried out step by step according to the test tool. The overall test process and time are relatively stable, and the time-consuming is relatively long. Although some test tools themselves can perform parallel tests, the operation is relatively limited and will be constrained by the tool itself, which is inconvenient and inflexible. There is relatively great pressure on early detection of production line testing problems and performance improvement. [0003] Therefore, how to provide a process-controlled test method, system, readable storage medium and electronic equipment to solve the problem that in the prior art, the server test pro...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688G06F13/4221G06F11/2273G01R31/31707G01R31/31724G06F11/26G06F2213/0006G06F2213/0024
Inventor 宋宝栋
Owner INVENTEC PUDONG TECH CORPOARTION
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