Multi-mode array type scanning imaging device combined with multi-photon excitation

Abstract

The invention discloses a multi-mode array type scanning imaging device combined with multi-photon excitation, and belongs to the field of optical microscopic measurement. Aiming at different imagingrequirements of a transparent thin sample and a thick scattering sample, the multi-mode imaging device combining multi-photon excitation imaging and common wide-field fluorescence imaging is designedthrough selection of different light sources, and the two light sources can realize switching of multiple modes through combination of a beam splitter. A fixed micro-lens array is used for accuratelycontrolling an illumination mode and the position of an excitation point so as to generate sparse focus illumination, rapid scanning of a sample is completed, rapid double-resolution imaging of a transparent sample and a thick sample is achieved, and meanwhile the image contrast of the thick scattering sample is improved. Moreover, an adaptive aberration correction unit is introduced into the imaging system, so that the aberration of the system is reduced or eliminated, and the imaging depth and the imaging quality in a multi-photon imaging mode are improved.

Description

technical field [0001] A multi-mode array scanning imaging device combined with multi-photon excitation belongs to the field of optical microscopic measurement, and mainly relates to a multi-focus scanning micro-imaging device that can realize two-photon excitation and ordinary fluorescence detection. It specifically relates to a multi-mode array scanning imaging device that combines traditional wide-field imaging and two-photon imaging. Specifically, under different imaging requirements, the sample fluorescence is excited by a semiconductor laser and a pulsed femtosecond laser, and a fixed micro The lens array precisely controls the illumination pattern and the position of the excitation point to generate sparse focal illumination, enable fast scanning of the sample, and improve imaging contrast. At the same time, the system aberration is reduced through the adaptive aberration correction device, and the imaging quality is improved. Background technique [0002] In recent ...

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Problems solved by technology

[0006] In order to solve the problems of serious scattering effect of thick samples, difficulty in improving resolution, and slow imaging speed, a microscopic imaging method combining multiphoton excitation and arrayed multi-focus structured light illumination was proposed. The function of optical slicing realizes the detection of thick samples, and the wide-field fluorescence microscope can use ordinary semiconductor lasers to realize the imaging of transparent samples, and realize the switching of various modes through the combination of beam splitters

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