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High spectral resolution halogen tungsten lamp spectral irradiance measuring device and method thereof

A spectral irradiance and measuring device technology, which is applied in the field of high spectral resolution halogen tungsten lamp spectral irradiance measuring devices, can solve the problem of inability to meet the research needs of the halogen tungsten lamp spectral attenuation law hyperspectral reconstruction algorithm, etc. The effect of high resolution and high measurement efficiency

Inactive Publication Date: 2020-04-21
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] At present, the spectral irradiance of tungsten-halogen lamps is usually measured by a channel-type filter radiometer. Since the filter radiometer is a multi-spectral instrument, it can only measure the spectral irradiance of several bands, which cannot meet the spectral attenuation of tungsten-halogen lamps. Laws and research needs of hyperspectral reconstruction algorithms

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  • High spectral resolution halogen tungsten lamp spectral irradiance measuring device and method thereof
  • High spectral resolution halogen tungsten lamp spectral irradiance measuring device and method thereof
  • High spectral resolution halogen tungsten lamp spectral irradiance measuring device and method thereof

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[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] Such as Figure 1 to Figure 7 As shown, the present invention is a high spectral resolution tungsten halogen lamp spectral irradiance measuring device, including a measuring mechanism for placing the light source on an optical platform, and a monitoring device for measuring the light source in the measuring mechanism. The mechanism, the positioning and moving mechanism that can drive the monitoring mechanism to move, and the host computer that is used to measure the position of the monitoring and monitoring mechanism and can send instructions to the monitoring mechanism and the positioning a...

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Abstract

The invention relates to the technical field of spectral radiation metering, in particular to a high spectral resolution halogen tungsten lamp spectral irradiance measuring device and a high spectralresolution halogen tungsten lamp spectral irradiance measuring method thereof. The high spectral resolution halogen tungsten lamp spectral irradiance measuring device comprises a measuring mechanism,a monitoring mechanism, a positioning and moving mechanism and an upper computer, wherein the measuring mechanism comprises a standard lamp channel used for accommodating a standard lamp and a plurality of to-be-measured halogen tungsten lamp channels used for accommodating halogen tungsten lamps; the monitoring mechanism comprises a spectrum acquisition system; and the spectrum acquisition systemcomprises an integrating sphere and a spectrograph. According to the high spectral resolution halogen tungsten lamp spectral irradiance measuring device and the high spectral resolution halogen tungsten lamp spectral irradiance measuring method, the plurality of halogen tungsten lamps are sequentially arranged on an optical platform, the integrating sphere and the spectrograph form the spectrum acquisition system, the spectrum acquisition system reciprocates by means of the positioning and moving mechanism, and the spectrum acquisition system sequentially measures the spectral irradiance of each halogen tungsten lamp; and the advantages of high spectral resolution and high measurement efficiency are achieved.

Description

technical field [0001] The invention relates to the technical field of spectral radiometry, in particular to a device and method for measuring the spectral irradiance of a tungsten halogen lamp with high spectral resolution. Background technique [0002] In the field of climate research, studies on issues such as the Earth's radiation balance, global warming, and disaster prediction require stable remote sensing data spanning decades. According to research, only when the uncertainty of the on-orbit calibration of the reflected solar spectrum is less than 1% can the demand be met. However, at this stage, the on-orbit radiation calibration of domestic and foreign satellites uses standard lights plus diffuse reflectors or sunlight diffuses. Traditional means such as reflectors; affected by the launch process and space environment, these standards will drift or attenuate, and the radiation scale and the reference traceability chain will be broken, resulting in the inability to o...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/02G01J3/06G01J1/02G01R31/44
CPCG01J1/02G01J3/0202G01J3/06G01J2003/061G01R31/44
Inventor 张亚超夏志伟贾瑞栋叶新方伟
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI