Deep ultraviolet band composite sensitivity spectrometer

A spectrometer and sensitivity technology, which is applied in the field of spectrometers, can solve the problems of bulky size and low confidence in measurement results, and achieve the effects of reducing volume, improving spectral resolution, and increasing the number of total lines

Pending Publication Date: 2020-05-01
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of the existing Thomson diagnostic system with large volume and low confidence in measurement results, and to provide a deep ultraviolet band composite sensitivity spectrometer

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  • Deep ultraviolet band composite sensitivity spectrometer
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  • Deep ultraviolet band composite sensitivity spectrometer

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Embodiment Construction

[0023] The content of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0024]The invention provides a novel spectrometer with reflection type and double spectrometers sharing one recording device. The device is a composite sensitivity spectrometer applied to deep ultraviolet band (150nm-220nm). It realizes the combination of two spectrometers into one by interspersing and folding the optical paths of two spectrometers, and overlaps the outputs of the two to share a recording device (stripe camera), which greatly reduces the volume of the device. In use, in order to prevent the image overlap problem of the dual spectrometer, the focal length of the ion spectrometer is designed to be larger; on the one hand, the effective grating area is increased, and the spectral resolution ability of the spectrometer is improved; on the other hand, the The optical path of the ion spectrometer is such that...

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Abstract

The invention relates to a deep ultraviolet band composite sensitivity spectrometer and solves problems that a Thomson diagnosis system is large in size and low in measurement result confidence coefficient. In the spectrometer, a to-be-measured signal entering from an input end of the spectrometer is divided into two beams through a spectrum beam splitter; in the transmission light path, a light beam is reflected by an ion spectrum reflector I and an ion spectrum reflector II; then the light beam reaches an ion spectrum grating after being collimated by an ion spectrum collimating parabolic mirror; the light beam dispersed by the grating is focused on an ion image surface reflector through an ion spectrum focusing parabolic mirror, and the dispersed signal is focused and imaged on an imagesurface through an ion spectrum imaging ellipsoidal mirror; in the reflection light path, the light beam is collimated by a short-focus electron spectrum collimating parabolic mirror and then is diffracted and split by the electron spectrum grating, and the light beam dispersed by the grating is focused on an electron spectrum image surface reflector by the electron spectrum focusing parabolic mirror; the light beam is reflected to an electron spectrum imaging ellipsoidal mirror, and the electron spectrum imaging ellipsoidal mirror focuses and images the dispersed signal on a common image plane.

Description

technical field [0001] The invention relates to a spectrometer, in particular to a deep ultraviolet band composite sensitivity spectrometer. Background technique [0002] In inertial confinement laser fusion (ICF) research, parameters such as temperature, ion / electron density, and ion / electron flow rate in the radiation field are directly related to physical processes such as absorption, scattering, focusing into filaments, and energy transfer between beams. This physical process will reduce the energy of the targeting laser, destroy the symmetry of fusion fuel compression, and generate superthermal electrons to preheat the fuel to increase the difficulty of compression. To a certain extent, the ion / electron parameters determine the success or failure of fusion, and the research on ion / electron parameter diagnosis occupies a crucial position in ICF. However, for the high temperature and high density ions / electrons generated in the shooting, the general contact measurement c...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H05H1/00
CPCH05H1/0043
Inventor 闫亚东吴冰静何俊华曹宗英许瑞华
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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