A security inspection device and method based on a sparse array

Abstract

A security inspection device and method based on a sparse array, including a servo system, an antenna arm, a switch and a processor. During the process of controlling the rotation of the antenna arm by the servo system, the servo system continuously feeds back the real-time angle information during the rotation of the antenna arm to the processor through the switch, and the processor monitors the angle information transmitted by the servo system in real time, and calculates the angle information increment, the angle Every time Δθ is increased, the processor will give a set of control signals of the sparse transmitting antenna array and the sparse receiving antenna array to complete the electrical scanning of the sparse transmitting antenna array and the sparse receiving antenna array. According to the imaging results of the processor, after detection through deep learning algorithms, it is determined whether the person under inspection is carrying dangerous goods.

Description

technical field [0001] The invention relates to a security inspection device and method based on a sparse array, and relates to the field of millimeter wave security inspection imaging. Background technique [0002] In recent years, terrorist attacks at home and abroad have occurred frequently, and there are more and more types of dangerous goods. Traditional security inspection methods can no longer meet the needs of the current security inspection market. Traditional metal detectors can only detect metal contraband, and are powerless to plastic bombs and ceramic knives; although X-ray security inspection equipment can detect all prohibited articles, it poses a certain threat to human health and is not the best security inspection method. At present, millimeter-wave three-dimensional imaging technology is an effective method to replace traditional security inspection methods. The cylindrical scanning 3D imaging system of L3 company, the QPS 3D imaging system of RS company ...

AI Technical Summary

Problems solved by technology

At present, the millimeter-wave security inspection equipment on the market has the disadvantages of a large number of transceiver units and a long imaging time.

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