A special etching equipment for quartz wafer production and its application method

A technology of quartz wafers and etching equipment, applied in the directions of crystal growth, single crystal growth, single crystal growth, etc., can solve the problem that the cleaning solution and etching solution are difficult to recover and process, the etching depth is difficult to control, and the labor of the staff is increased. Intensity and other issues, to achieve the effect of easy control of etching time, uniform and controllable output, and improved etching quality

Active Publication Date: 2021-08-03
陈鸣明
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] When the quartz wafer is subjected to the wet etching process, the quartz wafer is first placed in the etching solution, and then after a period of time, the quartz wafer is placed in the cleaning solution for cleaning. The labor intensity of the staff is increased during the transfer process. On the other hand, the contact time between the etching solution and the quartz wafer is difficult to control, so it is often difficult to control the etching depth. After the etching is completed, the quartz wafer is cleaned with a cleaning solution. When the mixed waste liquid is difficult to recycle, it is difficult to recycle the cleaning solution and etching solution. In view of this, we propose a special etching equipment for quartz wafer production and its use method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A special etching equipment for quartz wafer production and its application method
  • A special etching equipment for quartz wafer production and its application method
  • A special etching equipment for quartz wafer production and its application method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0027] see Figure 1-6 , the present invention provides a technical solution: a special etching equipment for quartz wafer production, including a stand 1, a drive mechanism and a conveyor belt 5 are arranged on the stand 1, and the drive mechanism is located above the conveyor belt 5, and the two sides of the drive mechanism Both sides are equipped with connecting rod assemblies 2, and the connecting rod assembly 2 on the right is connected to the etching solution...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the field of quartz wafer production equipment, in particular to a special etching equipment for quartz wafer production and a method for using the same, including a stand on which a drive mechanism and a conveyor belt are arranged, the drive mechanism is located above the conveyor belt, and the drive mechanism There are connecting rod assemblies on both sides, the connecting rod assembly on the right is connected to the etching solution output mechanism, the connecting rod assembly on the left is connected to the cleaning liquid output mechanism, the cleaning liquid output mechanism is connected to the waste liquid recovery mechanism, and the conveyor belt passes through the chain The wheel assembly is connected with the driving mechanism, and multiple solution pools are fixed at equal intervals on the conveyor belt. This kind of special etching equipment for quartz wafer production and its use method drive the conveyor belt to transport the quartz wafer at a constant speed through the driving mechanism, so that the etching time is easy to control, and the etching solution is automatically injected, and the output of the etching solution is uniform and controllable. The waste liquid is recovered while cleaning the etched quartz wafer, thereby improving the cleaning effect and the efficiency of recovering the waste liquid.

Description

technical field [0001] The invention relates to the field of quartz wafer production equipment, in particular to a special etching equipment for quartz wafer production and a method for using the same. Background technique [0002] When the quartz wafer is subjected to the wet etching process, the quartz wafer is first placed in the etching solution, and then after a period of time, the quartz wafer is placed in the cleaning solution for cleaning. The labor intensity of the staff is increased during the transfer process. On the other hand, the contact time between the etching solution and the quartz wafer is difficult to control, so it is often difficult to control the etching depth. After the etching is completed, the quartz wafer is cleaned with a cleaning solution. When it is difficult to recycle the mixed waste liquid, it is difficult to recycle the cleaning solution and etching solution. In view of this, we propose a special etching equipment for quartz wafer production...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/67C30B33/10C30B29/18
CPCC30B29/18C30B33/10
Inventor 陈鸣明
Owner 陈鸣明
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products