Medium-energy-section compact electron beam ion trap high-charge-state ion spectrum device

A technology of ion spectroscopy and electron beams, which is applied in the field of high-charge state ion spectroscopy devices of compact electron beam ion traps in the middle energy range, can solve the problems of non-adjustable magnetic field strength, difficult magnetic field strength, and expensive operation costs, etc., to achieve Effect of compact device, low magnet temperature, and small magnet volume

Pending Publication Date: 2020-08-04
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

Although the energy of the high-energy EBIT electron beam can reach higher and can study ions with higher charge states, its operating cost is expensive, while the electron beam energy of the medium and low-energy EBIT is moderate, and the energy adjustment is more flexible
At present, there are two low-energy EBIT magnets in Fudan University in China, which can only reach a maximum of 5keV, and the domestic medium-energy EBIT is still vacant. It is a high-temperature superconducting magnet. The disadvantage of a permanent magnet is that the magnetic field strength cannot be adjusted. The disadvantage of a high-temperature superconducting magnet is that it is difficult to achieve a magnetic field strength of 1T under limited size conditions.

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  • Medium-energy-section compact electron beam ion trap high-charge-state ion spectrum device
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  • Medium-energy-section compact electron beam ion trap high-charge-state ion spectrum device

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Embodiment Construction

[0032] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0033] See attached figure 1 The device provided by the present invention mainly includes an electron beam ion trap EBIT body, a spectrometer for spectral line observation and an auxiliary system.

[0034] The EBIT body of the electron beam ion trap includes an electron emitter, a drift pipe set, a superconducting coil and an electron collector; the electron emitter is located above the entrance of the drift pipe, the drift pipe set is in the middl...

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Abstract

The invention discloses a medium-energy-section compact electron beam ion trap high-charge-state ion spectrum device which comprises a superconducting coil, an electron emitter, a drift tube, an electron collector, a gas injection system, a vacuum system, a low-temperature system, a high-voltage power supply system, a control display system, a protection system, a cooling system and a spectrograph. The electron generator emits electron beams, the electron beams collide with atoms from the gas injection system or ions in a low charge state in the drift tube to generate energy level transition,linear spectral radiation is generated, and a spectral system can perform spectral measurement through a pipeline connected to a center of the drift tube. The superconducting coil cooled by the low-temperature system is used for compressing a beam diameter of the electron beam, improving electron density and accelerating an ionization speed. The vacuum system is used for maintaining ultrahigh vacuum of an ion trap region and a vacuum environment required by a magnet and the spectrograph. An electron beam energy design of the device can reach 30keV, and spectral research of high-charge-state ions with transition energy below 30keV can be performed.

Description

technical field [0001] The invention relates to the field of high-energy physical equipment, in particular to a high-charge state ion spectrum device of a compact electron beam ion trap in the middle energy range. Background technique [0002] Electron Beam Ion Trap (EBIT) is a unique instrument, which can carry out high-charge state ion spectrum experiments by changing the electron beam energy. As a high-charge state ion observation device, it has many advantages. First, it can establish a narrower Most of the ions are in the same ionization state; secondly, in a good ultra-high vacuum environment, there is only one main element in the ion trap area; more importantly, its electron energy distribution is very narrow and can be finely adjusted energies for fine-level excitation, whereas in thermal plasmas, a large number of processes occur simultaneously, making it difficult to study a single effect; finally, the ion temperature in the electron beam ion trap EBIT is lower, wh...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/68G01N21/01
CPCG01N21/68G01N21/01
Inventor 吕波宾斌张洪明符佳王福地
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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