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AFM probe capable of being used for quantitative measurement, modification method and application of AFM probe

A technology for quantitative measurement and modification methods, which is applied in the fields of nanomechanics and experimental mechanics, and can solve problems such as affecting measurement accuracy, seeing nanoparticles, and increasing the uncertainty of probe consumption, achieving a wide range of applications and simple operation steps. Effect

Inactive Publication Date: 2020-08-07
DALIAN UNIV OF TECH
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Nanoparticles are extremely small in size and easy to agglomerate, making it difficult to manipulate a single nanoparticle. A large number of nanoparticles are often used as objects for processing. Currently, there are many methods of using nanoparticles to modify the tip of the AFM probe, most of which are directly processed on the tip of the AFM probe. Modification, the commonly used method is to disperse the nanoparticles into the solution, contact the probe tip with the solution, so that the nanoparticles are adsorbed to the surface of the tip, and the dispersion liquid will wet the entire probe tip or even the cantilever part due to capillary force. If the cantilever Contamination by particles will lead to the deterioration of the reflection of the cantilever to the laser light, affecting the measurement accuracy, and its modification effect is limited by the dispersion degree of the nanoparticle dispersion. The distribution of particles is irregular. Even if the indentation depth and adhesion force are obtained through experimental operations, the actual contact area between the nanoparticles and the object to be measured and the number of nanoparticles involved in the contact cannot be determined, so it is impossible to obtain a single particle and the object to be measured. It is difficult to carry out accurate quantitative measurement of data such as the adhesion force between them. In addition, such a method is largely unpredictable. The general observation method cannot see the nanoparticles during the modification process, and can only be modified. After the probe is observed by scanning electron microscope, the modification effect can be judged, and the consumption of the probe will also increase due to the uncertainty of the modification, thus increasing the time and economic cost of the experiment

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  • AFM probe capable of being used for quantitative measurement, modification method and application of AFM probe
  • AFM probe capable of being used for quantitative measurement, modification method and application of AFM probe
  • AFM probe capable of being used for quantitative measurement, modification method and application of AFM probe

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Embodiment Construction

[0027] The specific embodiments of the present invention will be described in detail below in conjunction with the technical solutions and accompanying drawings.

[0028] An AFM probe that can be used for quantitative measurement. The specific structure of the probe is as follows: micron-sized balls are attached to the tip of the AFM probe, and a large number of amorphous concave-convex structures are randomly distributed on the surface of the micron-sized balls, forming a rough On the surface, the nanoparticles are evenly attached to the rough surface of the pellet. The roughness of the rough surface is at the nanometer level, and the peak and valley values ​​of the rough surface are smaller than the size of the nanoparticles to be modified.

[0029] A method for modifying an AFM probe for quantitative measurement, wherein the needle tip of the AFM probe is modified with carbon microspheres whose surface uniformly adsorbs magnetic nanoparticles, and the method for modifying t...

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Abstract

The invention provides an AFM probe capable of being used for quantitative measurement, a modification method and the application thereof, and belongs to the technical field of nanomechanics and experimental mechanics. According to the invention, a layer of nano particles are uniformly adsorbed by micron-sized spheres with defects after the special treatment on the surfaces, and then the micron-sized spheres are attached to the tip of the AFM probe to finish the probe modification. The method specifically comprises the following steps of pretreating the micron-sized spheres; preparing a nano-particle dispersion liquid; adsorbing the nano particles by the micron-sized spheres; selecting the micron-sized spheres modified by magnetic nanoparticles; carrying out AFM probe modification. According to the present invention, the operation is simple and convenient, and the application range is wide,k the problem that the agglomeration shape of nanoparticles at the tip of the AFM probe is uncontrollable in conventional modification is solved, and through the observation of a scanning electron microscope, the interaction force between the unit nanoparticles and the surface of a measured object is calculated, so that the quantitative nano mechanical measurement is realized.

Description

technical field [0001] The invention belongs to the technical field of nanomechanics and experimental mechanics, relates to the modification of atomic force microscope probes, and in particular relates to an AFM probe which can be used for quantitative measurement, a modification method and an application thereof. Background technique [0002] Nanomaterials have unique microstructure and organizational morphology, which lead to great changes in their physical, chemical and mechanical properties, thus greatly broadening the application fields of materials. With the development of nanotechnology, on the one hand, the application of engineered nanoparticles (ENP) is becoming more and more extensive, which inevitably leads to the exposure of the human body to the nano-environment, causing potential adverse effects on the body; on the other hand, nanoparticles as A new type of material has also played a huge role in the field of biomedicine, such as targeted delivery of drugs, ma...

Claims

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Application Information

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IPC IPC(8): G01Q60/38B82Y40/00A61N2/08
CPCA61N2/004A61N2/06B82Y40/00G01Q60/38
Inventor 马建立于洁孙伟皓李姮吴成伟张伟韩啸马国军吕永涛
Owner DALIAN UNIV OF TECH
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