A far-infrared detector and a near-field microscope

A detector and far-infrared technology, applied in the field of detectors, can solve the problems of weak terahertz signal detection and large dark current, and achieve the effects of improved detection efficiency, low noise equivalent power, and reduced volume

Active Publication Date: 2022-04-19
UNIV OF SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In comparison, terahertz photodetectors using photoelectric detection have the characteristics of fast response speed and high detection sensitivity, but the dark current of traditional terahertz photodetectors is large, which makes it impossible to detect weak terahertz signals.

Method used

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  • A far-infrared detector and a near-field microscope
  • A far-infrared detector and a near-field microscope
  • A far-infrared detector and a near-field microscope

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Embodiment Construction

[0037] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0038] The embodiment of the present application provides a far-infrared detector, such as figure 1 , figure 2 , image 3 and Figure 4 Shown, described far-infrared detector comprises:

[0039] Needle-like structure 10;

[0040] Graphene quantum dots 20 positioned on the side or bottom surface of the needle-like structure 10; The distance between the bottom surfaces of 10 is less than or equal to the preset distance;

[0041] Two graphene electrodes 30 connected symmetricall...

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Abstract

The application discloses a far-infrared detector and a near-field microscope, wherein the far-infrared detector uses graphene quantum dots as detection elements, and graphene quantum dots have wide-spectrum light absorption, high electrical and thermal conductivity, and low electron-phonon Coupling and other beneficial properties can efficiently detect terahertz signals. In addition, the far-infrared detector places graphene quantum dots on the bottom surface of the needle-like structure or on the side near the bottom surface, which greatly improves the detection efficiency of graphene quantum dots, which can be used for the detection of extremely weak terahertz signals, and is even expected It can realize the detection of terahertz single photons, and can greatly reduce the volume of the entire far-infrared detector and the near-field microscope, so that the near-field microscope with the far-infrared detector can be placed in a very narrow space (such as cryogenic strong in a magnetic field environment). Finally, the far-infrared detector only needs to fix the needle-like structure during use, which simplifies the detection process of terahertz signals.

Description

technical field [0001] The present application relates to the technical field of detectors, and more specifically, to a needlepoint far-infrared detector and a near-field microscope. Background technique [0002] Terahertz waves refer to electronic waves with a frequency of 0.1-10THz, which are connected between the infrared band and the microwave band on the electromagnetic spectrum, and are called far-infrared waves. [0003] Due to the many excellent properties of terahertz waves, such as good penetration, wide spectral coverage, picosecond-level transients, and low ionization characteristics, terahertz technology provides a great opportunity for people to characterize and micromanipulate matter. It has great theoretical and technical support, and has great achievements in the fields of high spatial and temporal resolution detection and imaging, large capacity and high security medium and short distance communication, radio astronomy detection, atmospheric and environment...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/18G01J1/42G01N21/3581H01L31/028H01L31/0352H01L31/09
CPCG01Q60/18G01N21/3581G01J1/42H01L31/035218H01L31/028H01L31/09
Inventor 向奎王纪浩黄秋萍陆轻铀陆亚林
Owner UNIV OF SCI & TECH OF CHINA
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