A far-infrared detector and a near-field microscope
A detector and far-infrared technology, applied in the field of detectors, can solve the problems of weak terahertz signal detection and large dark current, and achieve the effects of improved detection efficiency, low noise equivalent power, and reduced volume
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0038] The embodiment of the present application provides a far-infrared detector, such as figure 1 , figure 2 , image 3 and Figure 4 Shown, described far-infrared detector comprises:
[0039] Needle-like structure 10;
[0040] Graphene quantum dots 20 positioned on the side or bottom surface of the needle-like structure 10; The distance between the bottom surfaces of 10 is less than or equal to the preset distance;
[0041] Two graphene electrodes 30 connected symmetricall...
PUM
Property | Measurement | Unit |
---|---|---|
diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com