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Three-dimensional groove type ferroelectric memory and preparation method thereof

A ferroelectric memory, trench type technology, applied in the field of memory

Active Publication Date: 2020-10-20
XIANGTAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the three-dimensional integration technology that can guarantee high-density integration, low-cost production and high reliability at the same time remains to be broken through

Method used

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  • Three-dimensional groove type ferroelectric memory and preparation method thereof
  • Three-dimensional groove type ferroelectric memory and preparation method thereof
  • Three-dimensional groove type ferroelectric memory and preparation method thereof

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Embodiment Construction

[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.

[0033] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0034] figure 1 It is a schematic diagram of the three-dimensional structure of the three-dimensional trench ferroelectric memory provided by the present invention, figure 2 It is a top view of the trench type memory cell string in the three-dimensional trench type ferroelectric memory provide...

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Abstract

The invention discloses a three-dimensional groove type ferroelectric memory and a preparation method thereof. The three-dimensional groove type ferroelectric memory comprises a substrate (1) and a conductive layer (2) arranged on the substrate (1). A laminated structure arranged on the conductive layer (2) comprises a plurality of horizontal isolation layers (3) and control gate electrodes (4) which are arranged in an overlapping manner. The plurality of trench-type memory cell strings (5) vertically penetrate through the laminated structure, and each trench-type memory cell string (5) comprises a trench hole (11) which vertically penetrates through the laminated structure and has a trench bottom embedded into the conductive layer (2). A buffer layer (6), a ferroelectric film layer (7), achannel layer (8) and a filling layer (9) are sequentially laid on the side wall and the groove bottom of the groove hole (11). The control gate electrode (4), the buffer layer (6), the ferroelectricfilm layer (7) and the channel layer (8) form a plurality of ferroelectric field effect transistors which are connected in series. According to the ferroelectric memory, more compact wiring can be obtained, and higher-density integration can be realized; during preparation, required materials are sequentially deposited, etching is not needed, and the reliability of the ferroelectric memory is ensured.

Description

technical field [0001] The invention relates to the technical field of memory, in particular to a three-dimensional trench type ferroelectric memory and a preparation method thereof. Background technique [0002] Transistor type ferroelectric memory - ferroelectric field effect transistor (FeFET) is to replace the gate dielectric layer in field effect transistor (MOSFET) with ferroelectric thin film material, and control the conduction of channel current by changing the polarization direction of ferroelectric thin film material Pass and cut off, so as to realize the storage of information. FeFET memory has the advantages of non-volatility, low power consumption, fast read and write speed, etc., and the unit structure is simple, and the theoretical storage density is large. Therefore, FeFET memory is considered to be one of the most potential new memory. [0003] However, for a long time, the actual storage density of FeFET memory is quite different from the theoretical val...

Claims

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Application Information

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IPC IPC(8): H01L27/11507H01L27/11509H01L27/11514H01L29/78H01L29/786H01L21/34
CPCH01L29/78391H01L29/78693H01L29/66969H10B53/40H10B53/20H10B53/30
Inventor 曾斌建周益春廖敏
Owner XIANGTAN UNIV
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