323 results about "Electric fuses" patented technology

A structure and method of fabricating reversible fuse and antifuse structures for semiconductor devices is provided. In one embodiment, the method includes forming at least one line having a via opening for exposing a portion of a plurality of interconnect features; conformally depositing a first material layer over the via opening; depositing a second material layer over the first material layer, wherein the depositing overhangs a portion of the second material layer on a top portion of the via opening; and depositing a blanket layer of insulating material, where the depositing forms a plurality of fuse elements each having an airgap between the insulating material and the second material layer. The method further includes forming a plurality of electroplates in the insulator material connecting the fuse elements. In another embodiment, the method includes depositing a first and a second material layer on a semiconductor substrate, wherein the second material layer having a higher electrical conductivity than the first material layer; selectively etching the first and second material layer to create at least one constricted region to facilitate electromigration of the second material; wherein the electromigration creates a plurality of micro voids; and forming a plurality of electrical contacts on the second material layer.

The ability to repair defective cells in a memory array, by replacing those cells with redundant cells, is improved using a redundant memory line control circuit that employs two types of redundancy programming. Most, or all, redundant memory lines can be programmed while the memory array is in a wafer state by, e.g., cutting laser fuses. But at least one memory line can be programmed subsequent to device packaging ("post repair") using, e.g., commands that cut electric fuses. Preferably, the redundant memory line(s) that are reserved for post repair are selectable among the same redundant memory lines that can be programmed using laser fuses. This allows all redundant memory lines to be available for laser repair, if needed, but also allows a redundant memory line to be selected for post repair after it has been determined that that redundant memory line is defect-free. This increases the likelihood that a device will be repairable, and yet does not unnecessarily waste redundant memory lines by pre-dedicating them to laser or post repair.

The present invention discloses a one-time programmable memory, an electric system, an electric fuse memory, a programmable resistance assembly memory and a method thereof, wherein the programmable resistance assembly memory comprising a plurality of programmable resistance memory units, the programmable resistance assembly is coupled to a first power supply voltage line; and a diode comprising at least a first active zone and a second active zone, wherein the first active zone is provided with a first type of doping, the second active zone is provided with a second type of doping, the first active zone provides a first end of the diode, the second active zone provides a second end of the diode, the first active zone and the second active zone are all located in a same hole, the first active zone is coupled to the programmable resistance assembly, and the second active zone is coupled to a second power supply voltage line. The first and second active zones are manufactured from the source electrode or the drain electrode of a complementary metal oxide semiconductor CMOS assembly, and the programmable resistance assembly is programmed through applying a voltage to the first and second power supply lines.

An electric fuse includes a wide interconnect and a narrow interconnect. The electric fuse has a juxtaposed region in which a plurality of straight line portions are juxtaposed with each other by folding the wide interconnect and the narrow interconnect has a narrower width than that of the wide interconnect, and, at the same time, is connected to the wide interconnect outside the juxtaposed region.

A polycide electric fuse device includes an underlay, and a semiconductor material layer arranged on the underlay. The semiconductor material layer includes an outgoing area with the same doping sorts on two ends and a middle undoped area or a middle area with the doping content lower than two ends of the outgoing area. The middle area is provided with one or a plurality of blowing areas. A metal silicide layer is arranged on the semiconductor material layer. The invention will control the blowing within the undoped or less doped middle area. After blowing, resistance medium value increases and distribution range narrows down. The invention also can prohibit the area overheating caused by current in blowing.

Electric apparatus having distinct electric terminals has an input power terminal of electrically insulating material, including a base of electric insulating material having a first electric terminal base portion and a second electric base portion spaced from that first electric base portion, and a barrier wall of insulating material on that base acting as an isolator between the first and second electric terminals on these base portions, and preferably also as a standoff for a protective cover. A plurality of electric fuse holders in that or other electric apparatus may be mounted in mutually spaced relationship, and a heat sink including a frame around that plurality of mutually spaced electric fuse holders is in heat-transfer relationship with these electric fuse holders, and includes a cross-piece between each adjacent pair of the mutually spaced electric fuse holders. A flame-resistant designation card for that or other apparatus has a first data-bearing section, a second data-bearing section, a first folding crease between such first and second data-bearing sections, a shorter third section adjacent that second data-bearing section, and a second folding crease between the shorter third section and the second data-bearing section. Fuse condition designation flags are rendered better visible by service personnel and fuse rating designation pins are better organized. Ground wire terminals are safeguarded against rotation and loosening.