Metal surface oxide layer thickness monitoring method based on optical image
A technology of oxide layer thickness and metal surface, which is applied in the field of power system, can solve the problems of damage to power equipment, low efficiency, high efficiency, etc., and achieve the effect of high detection efficiency
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Embodiment 1
[0036] Such as figure 1 Shown is an embodiment of a method for monitoring the thickness of an oxide layer on a metal surface based on an optical image, and the specific steps are as follows:
[0037] Step 1: acquiring images of oxide layers with different oxide layer thicknesses;
[0038] Step 2: extracting the chromaticity information of the image in step 1;
[0039] S2.1: Select an analysis area consisting of M×N pixels in the image, and extract the gray level of each pixel of the blue primary color in the analysis area;
[0040] S2.2: Calculate the ratio of the number of pixels of a certain gray level of the blue primary color in the analysis area to the total number of pixels in the analysis area to obtain the frequency of a certain gray level. The specific formula is:
[0041]
[0042] Among them, i is the gray level; NumB(i) is the number of pixels of gray level i; M×N is the total number of pixels.
[0043] S2.3: Repeat step S2.2 until the frequency distribution o...
Embodiment 2
[0050] Another embodiment of a method for monitoring the thickness of an oxide layer on a metal surface based on an optical image, the specific steps are as follows:
[0051] Step 1: acquiring images of oxide layers with different oxide layer thicknesses;
[0052] Step 2: extracting the chromaticity information of the image in step 1;
[0053] S2.1: Select multiple analysis areas consisting of M×N pixels in the same image, and extract the gray level of each pixel of the blue primary color in the analysis area;
[0054] S2.2: Calculate the ratio of the number of pixels of a certain gray level of the blue primary color in the analysis area to the total number of pixels in the analysis area to obtain the frequency of a certain gray level. The specific formula is:
[0055]
[0056] Among them, i is the gray level; NumB(i) is the number of pixels of gray level i; M×N is the total number of pixels.
[0057] S2.3: Repeat step S2.2 until the frequency distribution of all gray lev...
Embodiment 3
[0065] Another embodiment of a method for monitoring the thickness of an oxide layer on a metal surface based on an optical image. On the basis of Embodiment 1 and Embodiment 2, the specific process of step 1 is limited, and the specific steps are as follows:
[0066] In the first step, multiple groups of images with different oxide layer thicknesses are taken on the same device at different times and under the same lighting conditions, and are marked as different oxide layer thicknesses. By acquiring data from a certain device on site, the acquired data is closer to the actual work, but it takes a long time.
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