Method for measuring uniformity of nanocrystalline hard alloy

A technology of hard alloy and measurement method, which is applied in the direction of measuring device, test sample preparation, instrument, etc., can solve the problems of difficult popularization and application, complicated sample preparation steps, high capital investment, etc., and achieve easy focusing, difficult focusing, difficult effect

Pending Publication Date: 2020-11-27
江西江钨硬质合金有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is: when the electron backscatter diffraction method (EBSD) measures the grain size of the polished section of the nanocrystalline cemented carbide in the prior art, the sample preparation s

Method used

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  • Method for measuring uniformity of nanocrystalline hard alloy
  • Method for measuring uniformity of nanocrystalline hard alloy
  • Method for measuring uniformity of nanocrystalline hard alloy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] The measurement of the uniformity of WC / Co cemented carbide with Co as the binder phase is as follows:

[0032] S1. Sample preparation. Including mirror polishing and metallographic etching, where:

[0033] (1), mirror polishing: the specific operation is (1) sample pre-grinding: use a 75-micron diamond magnetic grinding disc, continue to flow water for grinding, and the grinding and polishing time is 2-6min; (2) sample coarse grinding: use 18 micron The diamond magnetic grinding disc is continuously flowing out of water for grinding, and the grinding and polishing time is 2-3 minutes; (3) Sample fine grinding: a 10-micron magnetic grinding disc is used, continuously flowing out of water for grinding, and the grinding and polishing time is 2-3 minutes; (4) Coarse Polishing: Use nylon polishing cloth to add 9-micron diamond suspension for automatic grinding, and the polishing time is 2-3 minutes; (5) Fine polishing: Use nylon polishing cloth for automatic grinding with ...

Embodiment 2

[0042] Measurement of homogeneity of cemented carbides with cubic carbides as inhibitors.

[0043] The measurement steps are the same as in Example 1.

[0044] Wherein the microstructure photograph that S2 observation step obtains sees attached figure 2 . From attached figure 2 It can be seen that the cemented carbide grains with cubic carbides as inhibitors are uniform and dense, and the average grain length is 0.30 μm. The use of field emission scanning electron microscopy (FESEM) can significantly improve the image resolution and achieve the purpose of simple and rapid measurement of the uniformity of nanocrystalline cemented carbide.

Embodiment 3

[0046] Measurement of homogeneity of cemented carbide with TiC as inhibitor.

[0047] The measurement steps are the same as in Example 1.

[0048] Among them, the photographing in the S2 observation step is set to 20,000 times, and the microstructure photos obtained are shown in the attached image 3 . From attached image 3 It can be seen that the cemented carbide grains with TiC as the inhibitor are uniform and dense, and the average grain length is 0.30 μm.

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Abstract

The invention relates to the field of alloy grain size measurement, and particularly discloses a method for measuring the uniformity of a nanocrystalline hard alloy. The method comprises three steps of: sample preparation, observation and statistics. The sample preparation comprises mirror polishing and metallographic corrosion steps, wherein the metallographic corrosion comprises the steps of: first-time WC corrosion, cobalt-phase corrosion and second-time WC corrosion. In the observation step, a field emission scanning electron microscope is used, and a 20000-40000-time microscopic structurepicture is shot through back scattering electron imaging. The statistics is characterized in that measurement software is used for measuring the grain size of each grain of the alloy, counting data and drawing a grain size distribution diagram to represent the uniformity of the alloy. The method is suitable for measuring the uniformity of the WC/Co hard alloy taking Co as a binding phase, and isfurther suitable for measuring the uniformity of the nanocrystalline hard alloy taking any one of cubic phase carbide, TiC and Ti (C.N) as an inhibitor. By applying the method, the measurement of theuniformity of the nanocrystalline hard alloy can be simply and quickly completed, and the image resolution can be remarkably improved.

Description

technical field [0001] The invention belongs to the field of measuring the size of alloy grains, and in particular relates to a method for measuring the uniformity of nanocrystalline hard alloy. Background technique [0002] The properties of cemented carbide depend on the microstructure, which changes during the manufacturing process, which in turn is influenced by the properties of the raw powder. Understanding microstructure is key to controlling and improving product performance, so it is important to measure microstructural properties, especially grain size and size distribution. [0003] For grain size measurements, manual or semi-automatic image analysis is usually used to obtain the intercept length. For some coarse-grained or high-contrast images, automatic analysis software can be used for analysis, but for most materials, especially fine-grained materials, it is difficult to obtain very clear images. Therefore, automatic analysis is generally not used. [0004]...

Claims

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Application Information

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IPC IPC(8): G01N23/203G01N23/20008G01N1/32
CPCG01N23/203G01N23/20008G01N1/32G01N2223/418
Inventor 梁瑜龚红丁辉辉汤昌仁
Owner 江西江钨硬质合金有限公司
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