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2 results about "Field emission scanning electron microscopy" patented technology

FIELD EMISSION SCANNING ELECTRON MICROSCOPY (FESEM) An electron beam is focused and subsequently raster scanned over a small rectangular area. the beam interacts with the sample it creates various signals like secondary electrons, internal currents, photon emission, etc.), all of which can be appropriately detected.

Electron microscope gun valve

ActiveCN224433500UEmission scanElectron microscope
This application relates to the field of field emission scanning electron microscopy (FET) technology, and in particular to an electron microscope gun valve. The electron microscope gun valve includes a valve seat and a second control valve disposed on the valve seat. The valve seat is sealed between the gun lens and the objective lens; the valve seat has a gas passage, including a first channel connecting to a molecular pump, a second channel connecting to an ion pump, and a third channel connecting to the gun lens, all three being interconnected. The second control valve can close the first channel to cut off its connection with the other two channels. Therefore, with the electron microscope gun valve of this application, which includes a gas passage and a second control valve, the molecular pump can be used to evacuate the microscope barrel and the ion pump first, allowing the ion pump to quickly reach the starting conditions before starting, thus avoiding forced start-up of the ion pump before the starting conditions are met, which would affect its service life, and effectively improving the efficiency of vacuum establishment in the microscope barrel.
Owner:ANHUI ZEYOU TECH CO LTD +1

A morphology-based method and system for classifying pores in tight reservoir porous media

PendingCN122135105ASystematizeRealize objectified representationImage analysisEnsemble learningMicro structurePorous medium
This invention discloses a morphology-based method and system for classifying pores in tight reservoir porous media, comprising: acquiring microstructural images of rock tight reservoir samples using field emission scanning electron microscopy; labeling the SEM images with two types of samples, pores and matrix / background, as training sets, and training a segmentation model for rock samples; segmenting the sample SEM images using the trained segmentation model to generate binary images that identify the background and pores; automatically measuring pore morphology parameters based on the binary images to obtain pore roundness and aspect ratio; classifying pore shapes according to preset quantitative classification thresholds for pore roundness and aspect ratio, and outputting statistical classification results; this invention achieves a systematic and objective characterization of pore cross-sectional shape, transforming the traditional subjective judgment-dependent pore morphology description into a quantifiable and comparable structural index, solving the problem that traditional pore morphology classification relies on subjective judgment and lacks unified quantitative standards.
Owner:SICHUAN UNIV