14 results about "Field emission scanning electron microscopy" patented technology

This application relates to the field of field emission scanning electron microscopy (FET) technology, and in particular to an electron microscope gun valve. The electron microscope gun valve includes a valve seat and a second control valve disposed on the valve seat. The valve seat is sealed between the gun lens and the objective lens; the valve seat has a gas passage, including a first channel connecting to a molecular pump, a second channel connecting to an ion pump, and a third channel connecting to the gun lens, all three being interconnected. The second control valve can close the first channel to cut off its connection with the other two channels. Therefore, with the electron microscope gun valve of this application, which includes a gas passage and a second control valve, the molecular pump can be used to evacuate the microscope barrel and the ion pump first, allowing the ion pump to quickly reach the starting conditions before starting, thus avoiding forced start-up of the ion pump before the starting conditions are met, which would affect its service life, and effectively improving the efficiency of vacuum establishment in the microscope barrel.

A system for the fabrication of ε-phase MnAl / Co bilayer thin films, consisting of: a) a high-frequency magnetron sputtering system for the deposition of multilayer thin films on a silicon substrate, the sputtering system comprising: • a system for maintaining base pressure, configured to maintain a constant pressure; • three 2-inch targets consisting of MnAl, Co and Ta; and • a substrate rotation mechanism configured to rotate the substrate at a constant number of revolutions per minute; b) a layer deposition unit that is operationally connected to the RF magnetron sputtering system and enables the sputtering system to deposit layers sequentially: • a 3 nm thick Ta buffer layer on the silicon substrate; • a 60 nm thick MnAl layer on the Ta buffer layer; • a Co layer with a thickness of 1 nm to 5 nm on the MnAl layer; and • a 5 nm thick Ta top layer on the Co layer; c) an annealing furnace configured to anneal the deposited Ta and MnAl layers for 2 hours at 600 °C before the Co layer is deposited; and d) a characterization unit for analyzing the produced thin films, wherein the characterization unit comprises the following: • an X-ray diffraction (XRD) system for structural characterization; • an optical 3D profilometer for measuring surface structure and mean roughness; and • a field emission scanning electron microscope (FESEM) with energy-dispersive X-ray spectrometer (EDS) for analyzing surface morphology and elemental composition.

To provide titanium oxide particles with few coarse particles and excellent homogeneity and dispersibility, a method for their production, and a slurry, a dispersion, a composition and a dielectric starting material that comprise the titanium oxide particles.SOLUTION: The titanium oxide particles are such that D90 (LD) / D50 (LD) of the titanium oxide particles as measured by laser diffraction / scattering analysis is greater than 1.0 and less than or equal to 2.0, and the concentration of coarse particles whose primary particle size exceeds 16 times D50 (SEM) of primary particles as observed under a field emission scanning electron microscope is 20 ppm or less (based on the number of particles). For their production, a source gas and oxidizing gas are introduced into a reaction tube and reacted, where a blowing outlet of a purge medium is provided on the inner wall of the reaction tube, and where the blowout angle of the purge medium and the blowout flow velocity (B) of the purge medium from the inner wall of the reaction tube are introduced such that the purge medium swirls along the inner wall of the reaction tube.SELECTED DRAWING: Figure 1

This invention relates to the field of materials analysis technology, specifically to a method for analyzing and identifying shale thin sections using a combination of optical microscopy and field emission scanning electron microscopy. First, from an optical perspective, the method combines the brightness distribution of bright-field images of shale thin sections with the birefringence deviation of cross-polarized images to determine mineral discrimination indices representing atomic number proxies. Then, based on the distribution of the mineral discrimination indices and the surface undulations of the shale thin sections, different biases are applied, and the positional bias vector is determined by combining this with the gray-level gradient distribution. Finally, based on the physical distance scale of the image and the pixel coordinate transformation process involving rotation and translation, the positional bias vector is used to determine the electron microscope stage coordinates corresponding to each pixel point for more accurate cross-scale positioning. This improves the accuracy of cross-scale positioning using optical microscopy and field emission scanning electron microscopy, significantly enhancing the reliability of shale thin section analysis and identification.

The present invention relates to the process for preparation of high-grade turbostratic graphene from subbituminous tertiary coal from North eastern region of India by ultrasonic-assisted chemical oxidation and ultrafiltration followed by thermal reduction process. More particularly, the present invention relates to the efficient, scalable, low-cost process for preparation of high-quality graphene by ultrasonication supported chemical oxidation, ultrafiltration followed by thermal reduction process from low-grade subbituminous Indian coals. The synthesis of coal-derived graphene material is confirmed by various analytical methods such as High-Resolution Transmission Electron Microscope (HRTEM), Field Emission Scanning Electron Microscopy (FESEM), X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and Fourier Transform Infrared (FTIR) spectroscopy. This process can produce graphene on a large scale without using harsh acids, making it safer and more eco-friendly than existing methods. The present invention offers a sustainable and effective way to produce graphene with potential applications in different domains.

The present disclosure provides a particle size statistical method of granular minerals of shale, comprising: collecting shale samples; cutting the collected samples into the size of 1 cm×1 cm×1 cm; performing argon ion polishing; magnifying the samples by the field emission scanning electron microscopy, collecting 500-1000 images; using Adobe Photoshop to seamlessly splice the collected images; using ImageJ in combination with EDS energy spectrum to determine types of mineral particles, performing background subtraction, and setting a reasonable grayscale threshold to classify the particle minerals; performing binary processing on the images of selected mineral particle types; identifying edges of granular minerals, and using a Analyze Particles command to statistically analyze and measure particle sizes, and drawing a particle size distribution histogram. The method can perform precise measurement and statistics on the particle sizes of shale particle minerals, and can perform full-scale statistical analysis on the distribution of different mineral particle sizes in the shale.

This invention discloses a morphology-based method and system for classifying pores in tight reservoir porous media, comprising: acquiring microstructural images of rock tight reservoir samples using field emission scanning electron microscopy; labeling the SEM images with two types of samples, pores and matrix / background, as training sets, and training a segmentation model for rock samples; segmenting the sample SEM images using the trained segmentation model to generate binary images that identify the background and pores; automatically measuring pore morphology parameters based on the binary images to obtain pore roundness and aspect ratio; classifying pore shapes according to preset quantitative classification thresholds for pore roundness and aspect ratio, and outputting statistical classification results; this invention achieves a systematic and objective characterization of pore cross-sectional shape, transforming the traditional subjective judgment-dependent pore morphology description into a quantifiable and comparable structural index, solving the problem that traditional pore morphology classification relies on subjective judgment and lacks unified quantitative standards.

The invention discloses an experimental research method for weld joint micro-damage induced crack propagation under a large-span temperature difference, and belongs to the technical field of oil and gas storage and transportation. Comprising the following steps: 1, inducing a welding part to generate micro-damage by utilizing an experiment table, so that a crack appears on a welding seam of the workpiece, and changing the hydrogen content, welding parameters and the performance of a welding material so as to induce the welding seam crack under different conditions; step 2, testing the weld crack obtained in the step 1 by using an electron probe analyzer, a transmission electron microscope (TEM), an X-ray diffraction analyzer (XRD) and a field emission scanning electron microscope (FESEM) so as to analyze an induced stress field near the tip of the weld crack, determining the influence of the weld crack tip microscopic accumulated damage on the weld crack propagation path and propagation mode; and step 3, based on a J integral theoretical equation and Gaussian integral, establishing an integral mode of the upper and lower surfaces of the weld material crack obtained in the step 1, and based on the J integral and an equivalent integral region method, carrying out secondary development on finite element software.

In one aspect, cutting tools are described herein comprising wear resistant coatings employing one or more refractory layers of polycrystalline α-Al2O3. Briefly, a coated cutting tool described herein comprises a substrate, and a coating adhered to the substrate, the coating comprising a layer of polycrystalline α-Al2O3 deposited by chemical vapor deposition (CVD), wherein at least 5% of all grain boundaries in the polycrystalline α-Al2O3 layer have a misorientation angle less than 15 degrees as determined using a field-emission scanning electron microscope (FESEM) and an electron backscatter diffraction (EBSD) detector.

The invention discloses a pure iron material and a preparation method and application thereof. Industrial pure iron and an aluminum block are smelted to obtain a rough cast ingot, the rough cast ingot is subjected to vacuum consumable remelting to obtain a pure iron cast ingot, the pure iron cast ingot is subjected to homogenization treatment to obtain a homogenized blank, and the homogenized blank is subjected to multidirectional forging to obtain a forge piece. And finally, the forge piece is magnetized and annealed to obtain the pure iron material. The pure iron material provided by the invention is high in purity, uniform in crystal grain and isotropic; the material has excellent magnetic conductivity, low coercive force and high magnetic saturation flux density, and is suitable for field emission scanning electron microscope pole shoes.

To provide a composition for chemical mechanical polishing and a polishing method that effectively suppress contamination of foreign matters during manufacturing and polish the surface of a semiconductor substrate to a flat surface.SOLUTION: The composition for chemical mechanical polishing according to the present invention contains abrasive grains including silica and a liquid medium, wherein when the aspect ratio of abrasive grains is x, which is the ratio x2 / x1 of the short diameter x1 and the long diameter x2 measured by field emission scanning electron microscopy, and the aggregation ratio is y, which is the ratio y2 / y1 of the average primary particle diameter y1 calculated from the BET specific surface area and the average secondary particle diameter y2 measured by the DLS method, x / y is 0.63 to 0.75, and the abrasive grain has at least one functional group selected from the functional groups represented by the following general formulae (1) to (4), -SO3-M+ (1), -COO-M+ (2), -NR1R2 (3), -N+R1R2R3M- (4), M+ represents a monovalent cation, M- represents an anion, and R1 to R3 each independently represent a hydrogen atom or a substituted or unsubstituted hydrocarbon group.SELECTED DRAWING: None

The invention discloses a testing device and method for rapidly detecting the thermal expansion coefficient of glass micro powder, and belongs to the technical field of testing. The device mainly solves the problem of accurately testing the thermal expansion coefficient of the glass micro powder. The device is mainly characterized by comprising a field emission scanning electron microscope, a slide, an in-situ cold and hot table, a computer processing system and the like, wherein the slide is arranged on the in-situ cold and hot table; the method comprises the following steps: (1) placing glass micro-powder to be detected in a slide; (2) placing the slide on an in-situ cold and hot table; (3) controlling a temperature control system of the in-situ cold and hot stage, and obtaining a clear image of the to-be-tested glass micropowder at the test temperature; (4) the computer processing system measures the particle size of the micro powder in the shot image; and (5) obtaining the thermal expansion coefficient of the to-be-measured glass micropowder through a thermal expansion coefficient calculation formula. The device and the method have the characteristic of being capable of conveniently and quickly detecting the thermal expansion coefficient of the glass micro powder, and are mainly used for providing a stable and reliable testing device and method for detecting the thermal expansion coefficient of the glass micro powder.

The invention provides a nickel-based cast superalloy crystal orientation difference testing method based on gamma'phase morphology, and belongs to the technical field of material tests.The nickel-based cast superalloy crystal orientation difference testing method specifically comprises the steps that a nickel-based cast superalloy sample is subjected to standard metallographic sample preparation and pretreatment, and a to-be-tested sample is obtained; performing grain area marking on the to-be-detected sample; placing the marked to-be-detected sample in a sample bin of a field emission scanning electron microscope, observing by utilizing acceleration voltage and combining with a secondary electron detector, and obtaining a dendritic crystal stem gamma'phase morphology image of each crystal grain area; according to the dendritic crystal stem gamma'phase morphology image of each crystal grain area, the gamma 'phase orientation angle is measured, and the distribution rule of the gamma' phase orientation angles of different crystal grain areas is analyzed. According to the processing scheme, the sample preparation cost is reduced, the requirements for equipment and operators are low, and the testing efficiency is improved.

The application discloses a field emission scanning electron microscope, which comprises a source-beam-angle-of-field control mirror, an objective lens, an image-beam-angle-of-field control mirror arranged between the source-beam-angle-of-field control mirror and the objective lens, and an aperture arranged between the source-beam-angle-of-field control mirror and the image-beam-angle-of-field control mirror, wherein the source-beam-angle-of-field control mirror is provided with a first pole piece, the image-beam-angle-of-field control mirror is provided with a second pole piece, and the objective lens is provided with a third pole piece; and a centering coil is arranged between at least one of the first pole piece and the aperture, the aperture and the second pole piece, and the second pole piece and the third pole piece. According to the field emission scanning electron microscope, the beam current can be adjusted and the beam angle can be optimized, the degree of freedom of the electron beam adjustment is effectively improved, and the centering effect of the electron beam and the magnetic lens is improved.