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23 results about "Emission scan" patented technology

The usual mode of scanner operation in which a tracer's distribution throughout a subject is detected for subsequent processing into an image.

Shale rock slice analysis and identification method based on combination of light microscope and field emission electron microscope

The invention relates to the technical field of material analysis, in particular to a light microscope-field emission electron microscope combined shale rock slice analysis and identification method, which comprises the following steps of: firstly, combining a brightness distribution condition represented by a bright field image of a shale rock slice and a birefringence deviation condition represented by a cross polarization image from an optical angle; determining a mineral discrimination index representing an atomic number agent; applying offsets of different sizes based on the distribution condition of mineral discrimination indexes and the surface fluctuation condition of shale rock slices, and determining a position offset vector by combining gray scale gradient distribution on the basis; and finally, determining the cross-scale positioning and more accurate electron microscope objective table coordinates corresponding to each pixel point in combination with a position offset vector in a pixel coordinate conversion process based on an image physical distance scale and rotation translation processing, so that the cross-scale positioning accuracy of the optical microscope and the field emission scanning electron microscope is higher. The reliability of analyzing and identifying the shale rock slice is obviously improved.
Owner:DAQING OILFIELD CO LTD +1

Contactless determination of coating features

Systems and methods are provided for contactless determining feature(s) of a layered coating. Such systems may include determiner unit and measurement unit including coating scanner, vibration explorer and optical arrangement. Coating scanner includes ingress-protected transmitter to emit scanning radiation, and ingress-protected receiver to sense interaction radiation caused by interaction of scanning radiation with coating layer(s). Vibration explorer includes ingress-protected emitter to emit exploration radiation, and ingress-protected sensor to sense reflection radiation caused by reflection of exploration radiation on coating to detect a vibration of the coating depending on the reflection radiation. Optical arrangement guides scanning radiation and / or exploration radiation towards common radiation direction, and guides interaction radiation towards ingress-protected receiver and / or reflection radiation towards ingress-protected sensor. Determiner unit determines coating feature(s) depending on interaction radiation sensed by coating scanner and vibration detected by vibration explorer. Methods and computer programs performable in said systems are also provided.
Owner:DAS NANO TECH SL

Electron microscope gun valve

ActiveCN224433500UEmission scanElectron microscope
This application relates to the field of field emission scanning electron microscopy (FET) technology, and in particular to an electron microscope gun valve. The electron microscope gun valve includes a valve seat and a second control valve disposed on the valve seat. The valve seat is sealed between the gun lens and the objective lens; the valve seat has a gas passage, including a first channel connecting to a molecular pump, a second channel connecting to an ion pump, and a third channel connecting to the gun lens, all three being interconnected. The second control valve can close the first channel to cut off its connection with the other two channels. Therefore, with the electron microscope gun valve of this application, which includes a gas passage and a second control valve, the molecular pump can be used to evacuate the microscope barrel and the ion pump first, allowing the ion pump to quickly reach the starting conditions before starting, thus avoiding forced start-up of the ion pump before the starting conditions are met, which would affect its service life, and effectively improving the efficiency of vacuum establishment in the microscope barrel.
Owner:ANHUI ZEYOU TECH CO LTD +1

Laser turning system, laser turning method, and part obtained by using such a system

PendingUS20260084247A1Laser beam welding apparatusEmission scanFemto second laser
A laser turning system (1) for producing a component (60) such as a timepiece component or a micromechanical component having a length less than 250 mm and / or a diameter less than 10 mm, the system comprising a rotary spindle (3) for moving a bar of material and a galvanometric scanner (12) capable of emitting a femtosecond laser beam scanning a generating profile of the component to be machined in the bar of material.
Owner:ROLEX SA +1

Heterogeneous terrain map reconstruction method and device based on spatial index and multi-dimensional ray detection, equipment and storage medium

This application discloses a method, apparatus, device, and storage medium for heterogeneous topographic map reconstruction based on spatial indexing and multidimensional ray detection, relating to the field of geographic information system processing technology. The method includes: emitting scanning rays within the geographic range corresponding to the target mapping area and obtaining their intersections with vector boundaries; classifying the target mapping area based on the intersections and scanning rays to identify boundary depressions and cavity edges; extracting background elevation points from a preset background topographic map library based on the identified boundary depressions and cavity edges; constructing a constrained Delaunay triangulation network and then smoothing it to obtain the target topographic file. This solves the problem of not being able to automatically identify irregular boundaries and cavities during stitching, which leads to elevation faults. It achieves automatic identification of the mapping area boundary morphology and accurate positioning of the elevation points to be filled without manual intervention.
Owner:深圳十沣科技有限公司

thermofield emission scanning electron microscope (8200)

ActiveCN309977169SEmission scanScientific instrument
1. The name of the design product: hot field emission scanning electron microscope (8200). 2. The use of the design product: precision scientific instrument for high-resolution topography observation and microstructure analysis of sample surface at nanometer scale. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
Owner:BEIJING ZHONGKE KEYI OPTOELECTRONICS TECH CO LTD

A method for analyzing and identifying thin sections of shale rocks using optical microscopy and field emission electron microscopy.

ActiveCN121410236BPreparing sample for investigationEarth material testingField emission scanning electron microscopyMicroscopy
This invention relates to the field of materials analysis technology, specifically to a method for analyzing and identifying shale thin sections using a combination of optical microscopy and field emission scanning electron microscopy. First, from an optical perspective, the method combines the brightness distribution of bright-field images of shale thin sections with the birefringence deviation of cross-polarized images to determine mineral discrimination indices representing atomic number proxies. Then, based on the distribution of the mineral discrimination indices and the surface undulations of the shale thin sections, different biases are applied, and the positional bias vector is determined by combining this with the gray-level gradient distribution. Finally, based on the physical distance scale of the image and the pixel coordinate transformation process involving rotation and translation, the positional bias vector is used to determine the electron microscope stage coordinates corresponding to each pixel point for more accurate cross-scale positioning. This improves the accuracy of cross-scale positioning using optical microscopy and field emission scanning electron microscopy, significantly enhancing the reliability of shale thin section analysis and identification.
Owner:DAQING OILFIELD CO LTD +1

Underwater range gating dynamic imaging method based on meta-heuristic attitude estimation

The invention discloses an underwater range gating dynamic imaging method based on meta-heuristic attitude estimation, and relates to the technical field of underwater imaging, and the method comprises the steps: building an underwater range gating laser imaging system, and obtaining a continuous space-time matched original scanning image sequence through synchronous control of laser emission, scanning and gating exposure; selecting a reference frame from an original scanning image sequence, determining an effective imaging area, modeling inter-frame rigid body motion by adopting a six-degree-of-freedom pose parameter, and constructing a global optimization objective function based on a gray mean square error; and designing a self-adaptive weighted pixel loss function, distributing weights for pixels through normalized gray and gradient information, and inhibiting the influence of a highlight area. According to the method, the meta-heuristic optimization thought is applied to the 6D pose estimation problem of underwater range gating laser imaging, a 6D pose optimization framework suitable for a high-sparseness and high-constraint scene is constructed based on PSO, and the fundamental challenges of scarcity of feature points and insufficient data sets are overcome.
Owner:OCEAN UNIV OF CHINA

An underwater range-gated dynamic imaging method based on meta-heuristic pose estimation

ActiveCN121522662BGuaranteed stabilityImprove local alignment accuracyImage enhancementImage analysisData setEmission scan
This invention discloses an underwater range-gated dynamic imaging method based on metaheuristic attitude estimation, belonging to the field of underwater imaging technology. The method includes: constructing an underwater range-gated laser imaging system; acquiring a continuous, spatiotemporally matched sequence of original scanned images by synchronously controlling laser emission, scanning, and gated exposure; selecting reference frames from the original scanned image sequence and determining the effective imaging region; modeling inter-frame rigid body motion using six-degree-of-freedom pose parameters; constructing a global optimization objective function based on gray-level mean square error; and designing an adaptive weighted pixel loss function, assigning weights to pixels by normalizing gray-level and gradient information to suppress the influence of bright areas. This invention applies metaheuristic optimization ideas to the 6D pose estimation problem of underwater range-gated laser imaging, constructing a 6D pose optimization framework suitable for highly sparse and highly constrained scenarios based on PSO, overcoming the fundamental challenges of feature point scarcity and insufficient datasets.
Owner:OCEAN UNIV OF CHINA

Attenuated total internal reflection (ftir) surface topography and composition analysis system, method and apparatus

The present invention relates to apparatuses, methods and systems comprising a frustrated total internal reflection (FTIR) based scanning device. The FTIR based scanning device comprises a transparent medium and one or more electromagnetic wave emitters that can emit scanning light into the transparent medium during a sample scanning procedure. One or more electromagnetic wave sensors, cameras and / or microscopes are directed towards a detection face of the transparent medium. These detection components receive scattered light from a sample contact face through the detection face. The apparatus utilizes the scattered light to render a sample surface topography or material composition of the sample contact face during the sample scanning procedure. Furthermore, the one or more electromagnetic wave emitters can comprise a plurality of LEDs or electromagnetic wave emitters corresponding to different wavelengths for generating a three-dimensional topography image from the scattered light.
Owner:GS HEALTH MATRIX LLC

A method, system, and storage medium for defect detection in dispensing processes.

PendingCN122306827AEmission scanLight beam
This embodiment provides a defect detection method, system, and storage medium for dispensing processes. The system includes a main camera, a slave camera, and an optical device. The main camera and slave camera are used to capture images of the target micelles from different shooting angles. The method includes: during the initial defect detection, emitting a scanning beam towards the target dispensing via the optical device, the intensity of the scanning beam being less than the intensity of the detection beam used for formal defect detection; acquiring scanning images of the target dispensing under the illumination of the scanning beam using both the main camera and the slave camera; determining the illumination parameters of the detection beam during defect detection based on the scanning images; emitting a detection beam towards the target dispensing via the optical device based on the illumination parameters; acquiring detection images of the target dispensing under the illumination of the detection beam using both the main camera and the slave camera; and determining the dispensing quality of the target dispensing based on the detection images. This embodiment achieves efficient and accurate detection of dispensing defects.
Owner:SICHUAN YITIAN TECH CO LTD

Method for detecting silicon deposition uniformity in sample to be detected

The embodiment of the invention relates to a method for detecting the deposition uniformity of silicon in a to-be-detected sample. The method comprises the following steps: placing the to-be-detected sample containing a silicon carbon material on a field emission scanning electron microscope sample table; adjusting the field emission scanning electron microscope to a preset magnification factor, and collecting a first to-be-detected sample picture; inputting the first to-be-detected sample picture for brightness adjustment to obtain a second to-be-detected sample picture; performing binarization processing on the second to-be-detected sample picture to obtain a silicon carbon particle picture and a particle gap picture; counting the number of silicon-carbon particles in the silicon-carbon particle picture, and calculating the area of each silicon-carbon particle to obtain a silicon-carbon particle statistical picture; mapping each silicon carbon particle statistical picture to each second to-be-detected sample picture to calculate the disorder degree in the particles in the to-be-detected sample; and processing the particle gap picture and the second to-be-detected sample picture to obtain a third to-be-detected sample picture, and calculating the deposition uniformity among particles in the to-be-detected sample.
Owner:LIYANG TIANMU PILOT BATTERY MATERIAL TECH CO LTD

A method for in-situ identification of solid bitumen in shale based on electron microscope-raman spectrum

The application discloses a method for in-situ identification of solid bitumen in shale based on electron microscopy-Raman spectroscopy, and relates to the field of oil geological detection, which comprises the following steps: obtaining a whole rock optical section, performing in-situ identification operation to obtain a chemical structure spatial distribution map of the solid bitumen block; the in-situ identification operation comprises the following steps: using an optical microscope to identify and mark the solid bitumen; using the photo-electricity combined function of a field emission scanning electron microscope to determine the position of the mark in the electron microscope field of view, and then obtaining a surface morphology characteristic image of the solid bitumen block; based on the image positioning function of a Raman spectrometer, using the area scanning mode of the Raman spectrometer to determine the Raman area scanning image of the solid bitumen block; and superimposing the surface morphology characteristic image and the Raman area scanning image to generate the chemical structure spatial distribution map. The application realizes the matching of the solid bitumen image data obtained by different devices, and is helpful for accurate analysis of the solid bitumen in shale.
Owner:SANYA MARINE OIL & GAS RESEARCH INSTITUTE NORTHEAST PETROLEUM UNIVERSITY +1

Coordinate measurement method for optoelectronic scanning measurement system based on response pattern

The application discloses a photoelectric scanning measurement system coordinate measurement method based on a response mode, which comprises the following steps: a response type transmitting station transmits a synchronous signal to a processor through a wire at the start of each measurement period, and records the transmission time; the response type transmitting station emits scanning laser to a measurement space, scanning light is captured by a relay response unit, the relay response unit processes the scanning light signal and emits response laser to the space, and the receiving time t of the response laser is recorded by the transmitting station pi ; a response type transmitting station geometric measurement model is constructed, the rotation angle of a scanning light plane is obtained from the transmission time, the receiving time and the transmitting station parameters, and then the coordinates of a point in the space are solved. The application acquires accurate measurement scanning light arrival time, breaks through the problem that the measurement distance is limited in the traditional measurement mechanism, has good feasibility, flexible construction and low cost, and can realize effective growth of the working distance of a measurement system.
Owner:TIANJIN UNIV

A morphology-based method and system for classifying pores in tight reservoir porous media

PendingCN122135105ASystematizeRealize objectified representationImage analysisEnsemble learningMicro structurePorous medium
This invention discloses a morphology-based method and system for classifying pores in tight reservoir porous media, comprising: acquiring microstructural images of rock tight reservoir samples using field emission scanning electron microscopy; labeling the SEM images with two types of samples, pores and matrix / background, as training sets, and training a segmentation model for rock samples; segmenting the sample SEM images using the trained segmentation model to generate binary images that identify the background and pores; automatically measuring pore morphology parameters based on the binary images to obtain pore roundness and aspect ratio; classifying pore shapes according to preset quantitative classification thresholds for pore roundness and aspect ratio, and outputting statistical classification results; this invention achieves a systematic and objective characterization of pore cross-sectional shape, transforming the traditional subjective judgment-dependent pore morphology description into a quantifiable and comparable structural index, solving the problem that traditional pore morphology classification relies on subjective judgment and lacks unified quantitative standards.
Owner:SICHUAN UNIV

Root canal three-dimensional imaging detection system based on AI intelligence

PendingCN121313101ADentistrySensorsEmission scanLaser scanning
The invention discloses a root canal three-dimensional imaging detection system based on AI intelligence. The system comprises a handheld operation end, an optical probe, a mechanical arm, an AI processing unit and an AR display system. The handheld operation end is integrated with a touch screen; one end of the mechanical arm is fixedly connected with the handheld operation end, and the other end of the mechanical arm is fixedly connected with the optical probe; the optical probe is integrated with a 3D laser scanning module, a multispectral sensor and an OCT imaging unit, the 3D laser scanning module is used for emitting scanning laser to obtain surface contour data of a root canal, the multispectral sensor is used for collecting spectral information of root canal tissue, and the OCT imaging unit is used for obtaining tomography data of an internal structure of the root canal. Root canal full-dimension information is obtained through multiple modules of the optical probe, AR visual display is performed after AI analysis, a mechanical arm is arranged for stable operation, the problems that traditional information is insufficient and poor and unstable in display are solved, and the diagnosis and treatment efficiency and accuracy are improved.
Owner:昆山牙博士口腔门诊部有限公司 +1

Analysis method for corresponding relation between slab macroscopic center segregation and microcosmic precipitate

The invention discloses a method for analyzing a corresponding relation between slab macroscopic center segregation and microscopic precipitates, and belongs to the technical field of metal material detection. The method comprises the following steps: firstly, carrying out low-power corrosion on a slab sample, and clearly displaying a macroscopic central segregation zone; then, according to the morphology and corrosion depth of a segregation zone, precisely cutting out thick tensile samples at specific positions representing different segregation degrees (no segregation, slight segregation and serious segregation); breaking the thick tensile sample on a tensile testing machine to obtain fractures containing different segregation degree information; and finally, observing and analyzing a specific area of the fracture by utilizing a field emission scanning electron microscope, and qualitatively and quantitatively identifying the type, size, distribution and quantity density of the precipitates. According to the method, the direct and in-situ corresponding relation between the macrosegregation and the microscopic precipitate is established, and an accurate and reliable experimental basis is provided for accurately evaluating the slab center quality and optimizing the continuous casting and rolling process.
Owner:HUNAN VALIN XIANGTAN IRON & STEEL CO LTD

Method for detecting added elements of hard alloy

The invention discloses a method for detecting added elements of a hard alloy, which relates to the technical field of detection and comprises three steps of sample preparation, observation and detection. The sample preparation comprises the steps of polishing and grinding; according to the observation, a field emission scanning electron microscope is used, and 10000-20000 times of microscopic structure pictures are shot through back scattering electron imaging. According to the detection, an energy dispersion X-ray spectrum method is used, and the microstructure, elemental composition and content information of the surface of the sample can be provided. The main components of the hard alloy are tungsten carbide, cobalt and additives, so that common additives are distributed in a grain boundary and a cobalt phase, and the content of the other additive is lower than 0.2%-1.5%, so that common energy spectrums do not necessarily detect additive elements, the alloy can be polished, and the alloy quality is improved. A microscopic structure photo is shot through back scattering electron imaging, a tungsten carbide phase and a cobalt phase can be clearly distinguished through the back scattering photo, and additive elements can be detected by applying an energy spectrum in a cobalt phase area.
Owner:江西江钨硬质合金有限公司

Zinc measurement

The present application provides a method for measuring zinc in a solution, the method comprising: preparing an indicator solution wherein the indicator solution comprises 8-hydroxy-5-quinolinesulfonic acid; introducing an indicator solution into the solution wherein the solution contains an amount of zinc and the introduction causes a fluorescence change in the solution in response to the indicator solution reacting with zinc; adding a moderator to the solution, wherein the moderator prevents the interferent from binding to the indicator; and measuring the amount of zinc in the solution by measuring a change in fluorescence intensity and comparing the change in intensity to a calibration curve generated based on conditions of the solution, where the conditions affect the fluorescence measurement of the solution, where the fluorescence intensity is proportional to the concentration of zinc in the solution, wherein low-range zinc detection is used, and the low-range zinc detection uses an emission scanning mode of a fluorospectro photometer. Other aspects are described and claimed.
Owner:HACH

Scanning optical system, microscope optical system, and microscope device

PCT designated stageWO2026053893A1MicroscopesEmission scanOphthalmology
This scanning optical system is provided between a scanning mechanism which scans light and emits scanning light, and an objective optical system which receives and emits the scanning light toward a sample and simultaneously receives light from the sample and forms a primary image plane at a position conjugate with the sample, and is configured to receive the scanning light and emit the scanning light toward the objective optical system. The scanning optical system has a plurality of lens components and has positive refractive power as a whole. At least one of the plurality of lens components is a movable lens component that is movable along the optical axis.
Owner:NIKON CORP

Three-dimensional scanning system and three-dimensional scanner

ActiveCN223896795UDentistryUsing optical meansEmission scanGalvanometer
The utility model relates to a three-dimensional scanner. The three-dimensional scanner comprises a shell; the scanning light path is located in the shell and used for emitting scanning light and receiving detection light reflected by a target object according to the scanning light to generate image data; the galvanometer is located in the shell, located on a light path of the scanning light and used for reflecting the scanning light from the scanning light path; the driving mechanism is located in the shell, connected with the galvanometer and used for driving the galvanometer to deflect in a reciprocating mode, so that the galvanometer projects the scanning light to different areas on the target object in a time-sharing mode. The image data corresponding to the detection light reflected by different areas on the target object is used for acquiring three-dimensional information of the target object. The utility model further provides a three-dimensional scanning system.
Owner:SHINING 3D TECH CO LTD

Laser scanning microscope

To miniaturize a laser scanning microscope and to enable observation in water or the like.SOLUTION: This microscope has a light source for emitting a scanning laser beam, a condenser lens, a photodetector for detecting fluorescence or the like from a sample, and an optical scanning mirror for scanning the laser beam from the light source, and the light source, the condenser lens, the photodetector, and the optical scanning mirror are stored in an integrated casing.SELECTED DRAWING: Figure 1
Owner:UNIVERSITY OF FUKUI +1

Field emission scanning electron microscope

ActiveCN115472480BElectric discharge tubesBeam angleEmission scan
The application discloses a field emission scanning electron microscope, which comprises a source-beam-angle-of-field control mirror, an objective lens, an image-beam-angle-of-field control mirror arranged between the source-beam-angle-of-field control mirror and the objective lens, and an aperture arranged between the source-beam-angle-of-field control mirror and the image-beam-angle-of-field control mirror, wherein the source-beam-angle-of-field control mirror is provided with a first pole piece, the image-beam-angle-of-field control mirror is provided with a second pole piece, and the objective lens is provided with a third pole piece; and a centering coil is arranged between at least one of the first pole piece and the aperture, the aperture and the second pole piece, and the second pole piece and the third pole piece. According to the field emission scanning electron microscope, the beam current can be adjusted and the beam angle can be optimized, the degree of freedom of the electron beam adjustment is effectively improved, and the centering effect of the electron beam and the magnetic lens is improved.
Owner:CHINAINSTRU & QUANTUMTECH (HEFEI) CO LTD