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Scintillator afterglow accurate measurement device and method

A technology of precise measurement and scintillator, which is applied in radiation measurement and instruments, etc., can solve the problems of low measurement accuracy of afterglow time, limited X-ray on-off speed and accuracy, etc., to expand testable parameters, improve test capability, highly reproducible effect

Pending Publication Date: 2020-12-04
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the technical problem that the existing afterglow test device uses a metal mechanical shutter to control the on-off of X-rays, which leads to the limitation of the on-off speed and accuracy of X-rays, and thus makes the measurement accuracy of the afterglow time lower, the invention provides a scintillator Apparatus and method for accurate measurement of afterglow

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  • Scintillator afterglow accurate measurement device and method
  • Scintillator afterglow accurate measurement device and method

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Embodiment Construction

[0043] The content of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0044] Such as figure 1 As shown, a scintillator afterglow accurate measurement device includes an X-ray shielding case 10, an X-ray generating mechanism, a test shielding case 20, a detector 15 and a time processing unit 22;

[0045] The X-ray generating mechanism is composed of a light source 2, a light source control circuit 11, a vacuum housing 7, an input window 4, a photocathode 5, a focusing electrode 6, an anode target 8 and an X-ray output window 11. The light source 2, the vacuum housing 7, the input The window 4 , the photocathode 5 , the focusing electrode 6 , the anode target 8 and the X-ray output window 11 are all located inside the X-ray shielding case 10 , and the light source control circuit 11 is located outside the X-ray shielding case 10 .

[0046] The vacuum housing 7 is a cylindrical structure wi...

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Abstract

The invention provides a scintillator afterglow accurate measurement device and method, and solves the problem of low afterglow time measurement accuracy of an existing afterglow test device. The device comprises an X-ray shielding shell, an X-ray generating mechanism, a test shielding shell, a detector and a time processing unit, the X-ray generating mechanism comprises a light source, a vacuum shell, an input window, a photoelectric cathode, a focusing electrode, an anode target and a light source control circuit. The light source control circuit controls on-off of the light source and sendsan initial signal to the time processing unit. An isolation sealing sleeve is arranged outside the light source; an X-ray output window is arranged between the side wall of the vacuum shell and the X-ray shielding shell; a cavity formed by the X-ray shielding shell, the isolation sealing sleeve, the vacuum shell and the X-ray output window is filled with an insulation heat dissipation medium; thedetector is arranged in the test shielding shell and used for sending a termination signal to the time processing unit and obtaining intensity information of afterglow of the scintillator to be tested, and the time processing unit is used for obtaining afterglow time information of the scintillator to be tested.

Description

technical field [0001] The invention relates to a scintillator afterglow performance measurement technology, in particular to a scintillator afterglow precise measurement device and method. Background technique [0002] Scintillators play an important role in high-energy physics, oil exploration, industrial testing, and medicine. It converts the energy of high-energy rays or high-energy particles into ultraviolet or visible light. It is an important part of the scintillation detector and determines the time of the scintillation detector. performance. The crystal scintillation counter made by coupling inorganic scintillator with photomultiplier tube, silicon photodiode or avalanche diode is an extremely important detection instrument in nuclear physics, high energy physics and nuclear medicine. The afterglow of the scintillator is an important performance of the scintillator. For example, the afterglow problem in the security inspection system will affect the quality of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T7/00
CPCG01T7/00
Inventor 刘永安盛立志强鹏飞苏桐刘哲田进寿赵宝升
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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