Novel electrostatic ion trap ion tangential introduction orbit deflection device
An electrostatic ion trap and deflection device technology, applied in the field of mass spectrometry analysis, can solve the problems of difficulty in detecting low-abundance signals, restricting popular use, high price, etc., achieving simple and convenient design and control, improving signal strength, and reducing ion loss. Effect
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[0027] The invention relates to a novel electrostatic ion trap ion tangentially introduced track deflection device, which is used in conjunction with the Orbitrap ion trap. The device can make the ions generated by the ion source tangentially enter the device continuously and be stored, and by controlling the voltage, the More ions enter the Orbitrap to be analyzed, reducing ion loss, thereby increasing the sensitivity of the instrument.
[0028] Such as Figure 1~3 As shown, the device specifically includes: a deflection outer rail 1, a deflection inner rail 2, an electrode 3 in the electrostatic ion trap, an ion orbit introduction channel 4, an ion introduction channel 8, a first DC power supply 11, a first pulse power supply 12 and The second pulse power supply 14.
[0029] The first DC power supply 11 is connected to the deflection outer rail 1 for providing a DC voltage to the deflection outer rail 1 . The second DC power supply 13 is connected to the deflecting inner r...
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