Processing method of large-light-emitting-angle substrate
A processing method and light-emitting angle technology, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve problems such as poor reliability, light loss of the shielding layer, mismatch of thermal expansion of materials, etc., and achieve good stability and reliability Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1
[0021] A method for processing a substrate with a large luminous angle, characterized in that it comprises the following specific steps:
[0022] S1. Prepare the substrate with the light-emitting epitaxial layer structure and electrode structure, wherein the thickness of the substrate is 100-300 μm, and the substrate material is transparent materials such as sapphire, diamond, silicon carbide, GaN, lithium aluminate, zinc oxide, etc. a kind of
[0023] S2. Evaporate a layer of metal film on the back of the substrate. The metal film is any one of Ni, Au, and Ag, and perform high-temperature rapid annealing on the metal film to obtain micro-nano-scale spherical metal particles, and the spherical metal particles are randomly distributed. On the back surface layer of the substrate, wherein the annealing temperature is 500-1000°C, the annealing time is 5-50s, and the thickness of the pattern composed of spherical metal particles is 10-1000nm;
[0024] S3. First, apply photoresist ...
Embodiment 2
[0026] A method for processing a substrate with a large luminous angle, characterized in that it comprises the following specific steps:
[0027] S1. Prepare the substrate with the light-emitting epitaxial layer structure and electrode structure, wherein the thickness of the substrate is 100-300 μm, and the substrate material is transparent materials such as sapphire, diamond, silicon carbide, GaN, lithium aluminate, zinc oxide, etc. a kind of
[0028] S2. Use PECVD equipment or atomic layer deposition coating equipment to make a layer of dielectric film on the back of the substrate. The dielectric film is any one of SiO2, Si3N4, and Al2O3, and the thickness of the dielectric film is 50-5000nm; layer metal film, the metal film is any one of Ni, Au, Ag, and the metal film is subjected to high-temperature rapid annealing to obtain micro-nano scale spherical metal particles, and the spherical metal particles are randomly distributed on the surface layer of the back of the substra...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
width | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com