Fully terahertz-driven electron beam manipulation and characterization system and method
A manipulation system and electron beam technology, applied in the field of ultrafast diagnosis, can solve the problems of poor stability, low time resolution, complex structure, etc., and achieve the effects of high stability, small size, and improved deflection sensitivity
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[0055] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention and the accompanying drawings. Apparently, the described embodiments do not limit the present invention.
[0056] like figure 1 As shown, a full terahertz-driven electron beam manipulation and characterization system in this embodiment includes a femtosecond laser 1, an ultraviolet laser pulse generator 3, a first mirror 5, a beam splitter 6, a single-cycle terahertz Generating device 8, second reflector 10, multi-period terahertz generating device 12, camera 23, vacuum chamber 24, and a DC acceleration system arranged sequentially along the optical path in vacuum chamber 24, a perforated off-axis parabolic mirror 17, Terahertz electron beam steering system, terahertz deflection system 21 and fluorescent screen 22;
[0057] In the vacuum chamber 24, an anode 16 is installed behind the photocathode 14, and the slit ...
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