Fully terahertz-driven electron beam manipulation and characterization system and method

A manipulation system and electron beam technology, applied in the field of ultrafast diagnosis, can solve the problems of poor stability, low time resolution, complex structure, etc., and achieve the effects of high stability, small size, and improved deflection sensitivity

Active Publication Date: 2021-12-14
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] The present invention aims to solve the problems of low temporal resolution, complex structure and poor stability in existing streak cameras, and provides a full terahertz-driven electron beam manipulation and characterization system and method

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  • Fully terahertz-driven electron beam manipulation and characterization system and method
  • Fully terahertz-driven electron beam manipulation and characterization system and method
  • Fully terahertz-driven electron beam manipulation and characterization system and method

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Embodiment Construction

[0055] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention and the accompanying drawings. Apparently, the described embodiments do not limit the present invention.

[0056] like figure 1 As shown, a full terahertz-driven electron beam manipulation and characterization system in this embodiment includes a femtosecond laser 1, an ultraviolet laser pulse generator 3, a first mirror 5, a beam splitter 6, a single-cycle terahertz Generating device 8, second reflector 10, multi-period terahertz generating device 12, camera 23, vacuum chamber 24, and a DC acceleration system arranged sequentially along the optical path in vacuum chamber 24, a perforated off-axis parabolic mirror 17, Terahertz electron beam steering system, terahertz deflection system 21 and fluorescent screen 22;

[0057] In the vacuum chamber 24, an anode 16 is installed behind the photocathode 14, and the slit ...

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Abstract

The invention relates to ultrafast diagnostic technology, in particular to a full terahertz-driven electron beam manipulation and characterization system and method to solve the problems of low time resolution, complex structure and poor stability in existing streak cameras. The technical solution adopted in the present invention is: the full terahertz-driven electron beam manipulation and characterization system includes a femtosecond laser, an ultraviolet laser pulse generator, a first reflector, a beam splitter, a single-cycle terahertz generator, and a second reflector , multi-period terahertz generating device, camera, vacuum chamber, and a DC acceleration system arranged in sequence along the optical path in the vacuum chamber, an off-axis parabolic mirror with holes, a terahertz electron beam steering system, a terahertz deflection system and a fluorescent screen; The invention also provides a fully terahertz-driven electron beam manipulation and characterization method.

Description

technical field [0001] The invention relates to ultrafast diagnostic technology, in particular to a full terahertz-driven electron beam manipulation and characterization system and method. Background technique [0002] In the field of electric vacuum ultrafast diagnostics, precise manipulation of the generation and operation of electrons is the basis for high spatiotemporal resolution. [0003] Existing ultrafast optical pulses can reach sub-100 fs or even as magnitude, and corresponding ultrafast electron pulses can also reach hundreds of fs, or even several fs after compression. However, the measurement of this time-scale pulse is still facing challenges. Streak camera is one of the important tools to realize the characterization of ultrafast electron pulses. It converts the one-dimensional ultrafast time information into spatial information, so as to invert the time characteristics of the measured ultrafast electron pulses. But so far, the ultrafast electron pulse of th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H05H15/00H01S1/00G02B17/06G02F1/35G02F1/355H01P5/12
CPCH05H15/00H01S1/00G02B17/06G02F1/3501G02F1/353G02F1/3551H01P5/12
Inventor 陈萍田进寿李杭王兴赛小锋缑永胜何凯刘百玉刘虎林高贵龙张敏睿薛彦华王俊峰徐向晏汪滔辛丽伟
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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