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Germanium silicon-silicon through hole structure and preparation method thereof

A technology of through-silicon vias and silicon germanium, which is applied in semiconductor/solid-state device manufacturing, semiconductor/solid-state device components, semiconductor devices, etc., can solve the problem of not having high inductance value, and achieve the effect of reducing parasitic resistance

Active Publication Date: 2021-03-09
FUDAN UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, the function of the currently prepared TSV structure is limited to the interconnection channel between the upper and lower chips, and has no other functions. As an important passive device in integrated circuits, inductors can be used to make filters and Oscillators, these devices require high inductance values, and the traditional TSV structure does not have an inductance structure with high inductance values

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  • Germanium silicon-silicon through hole structure and preparation method thereof
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  • Germanium silicon-silicon through hole structure and preparation method thereof

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Embodiment Construction

[0068] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are part of the present invention Examples, not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by those skilled in the art to which the present invention belongs. As used herein, "comprising" and similar words mean that the elements or items appearing before the word include the elements or items listed after the word and their equivalents, without excluding other el...

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Abstract

The invention provides a germanium silicon-silicon through hole structure and a preparation method thereof. The TSV structure comprises a composite substrate structure, a trench structure, an inductance structure and a copper interconnection structure, wherein the composite substrate structure is internally provided with a through hole structure which is conducted up and down, the composite substrate structure comprises a substrate layer, the top of the substrate layer is provided with a plurality of composite layers, and the composite layer comprises a germanium-silicon material layer and a silicon material layer; the inductance structure is arranged on the inner wall of the groove structure and the inner wall of the through hole structure, and the interior of the groove structure is completely filled with the inductance structure; the inductance structure is provided with a first top contact layer and a first bottom contact layer respectively, and the upper end and the lower end of the copper interconnection structure are connected with a second top contact layer and a second bottom contact layer respectively. Thus, the TSV structure prepared by the invention not only can realizevertical connection between chips, but also has an inductance structure with a high inductance value; and the performance of the TSV structure is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a silicon germanium-silicon through hole structure and a preparation method thereof. Background technique [0002] With the rapid development of integrated circuit technology, microelectronic packaging technology has gradually become the main factor restricting the development of semiconductor technology. In order to achieve high density of electronic packaging, obtain better performance and lower overall cost, technicians have developed a series of advanced packaging technologies. Among them, three-dimensional packaging technology has good electrical properties and high reliability, and can achieve high packaging density at the same time, and is widely used in various high-speed circuits and miniaturized systems. [0003] The Through Silicon Vias (TSV) technology is a new technology for stacking chips in a three-dimensional integrated circuit to realize the intercon...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/522H01L23/528H01L21/768
CPCH01L23/5227H01L23/528H01L21/76898
Inventor 朱宝陈琳孙清清张卫
Owner FUDAN UNIV