Apparent defect detection equipment for protective film of chip resistor and application method
A technology of chip resistance and appearance defects, which is used in measuring devices, material analysis by optical means, instruments, etc., can solve the problem of not covering chip resistance, and cannot objectively reflect the quality of all chip resistance and chip resistance protective film. The problem of low efficiency is to achieve the effect of fast detection speed, labor saving and high detection accuracy
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[0016] figure 1 As shown in , a protective film appearance defect detection device for chip resistors includes a video camera, an industrial computer, a data storage unit, an identification unit, a judgment unit, and an alarm unit; the video camera is installed at the upper end of the chip resistor production line, The video camera and the industrial computer are connected through a data line, and the data storage unit, identification unit, judgment unit and alarm unit are application software installed in the industrial computer. There are chip resistors stored in the data storage unit, including protective film bulges, pockmarks, complete defects, partial defects, cracks, and protective film material accumulation fault pictures. The data storage unit stores a large number of picture feature data of known faults of the chip resistor protective film, and picture feature data of a qualified chip resistor protective film corresponding to the fault one-to-one.
[0017] figure 1...
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