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Radial shearing interferometer based on bifocal photon sieves

A technology of shearing interferometer and photon sieve, which is applied in the field of optical detection, can solve the problems of difficult application of optical system, complex optical path, and high requirements of experimental environment, and achieve the effect of simplifying experimental optical path, reducing processing difficulty, and improving stability

Pending Publication Date: 2021-08-13
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Radial shearing interferometers have many different structures, but they all require multiple optical elements to achieve shearing interference, which makes the optical path complex and requires high experimental environment, making it difficult to apply to different optical systems

Method used

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  • Radial shearing interferometer based on bifocal photon sieves
  • Radial shearing interferometer based on bifocal photon sieves
  • Radial shearing interferometer based on bifocal photon sieves

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Embodiment 1

[0018] see first figure 1 , figure 1 It is a schematic structural diagram of Embodiment 1 of the radial shear interferometer based on the bifocal photon sieve of the present invention. It can be seen from the figure that the radial shear interferometer based on the bifocal photon sieve of the present invention is characterized in that it includes a first bifocal Photon sieve 1, second bifocal photon sieve 2, image detector 3 and computer 4; along the input direction of the wavefront 0 to be measured are the first bifocal photon sieve 1, the second bifocal photon sieve 2, Image detector 3, the output end of the image detector 3 is connected to the input end of the computer 4, the first bifocal photon sieve 1 and the second bifocal photon sieve 2 are identical, and their two focal lengths are f1 and f2 respectively; the laser beam 0 to be measured is diffracted after entering the first bifocal photon sieve 1, forming two converging spherical waves, and the Airy disk of the firs...

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Abstract

A radial shearing interferometer based on bifocal photon sieves comprises two identical bifocal photon sieves, an image detector and a computer, wherein focuses of the two bifocal photon sieves correspond to each other to generate two sets of 4f systems, so that an incident wave surface to be detected is divided into two beams of wave surfaces with different sizes, and shearing interference occurs on the image detector, and the computer can extract the shear phase difference from the interferogram received by the image detector and can obtain the phase information carried in the light beam. The radial shearing interferometer has the advantages of being simple in structure, low in experimental environment requirement and high in anti-interference capacity, and can be applied to the fields of wavefront detection, interference imaging, adaptive optics and the like.

Description

technical field [0001] The invention relates to optical detection, in particular to a radial shearing interferometer based on a bifocal photon sieve. Background technique [0002] The basic principle of shearing interference technology is to copy the wavefront to be measured by means of light splitting, and to generate lateral or radial misalignment between the copied wavefront to be measured and itself, or to interfere with overlapping beams after rotation. The radial shearing interferometer was proposed by Brown in 1959. Because it does not need a standard reference wave, it is easy to design a common optical path and has strong system stability. It has been widely used in many fields such as wavefront detection, optical component quality detection, and adaptive optics. application. There are many different structures of radial shearing interferometers, but all of them require multiple optical elements to achieve shearing interference, which makes the optical path complex...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/02G02B27/42
CPCG01J9/0215G02B27/4205
Inventor 张军勇李垚村
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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