Optical module reliability monitoring method and device, computer equipment and storage medium

Abstract

The invention relates to the technical field of electric appliance monitoring, in particular to an optical module reliability monitoring method and device, computer equipment and a storage medium; the method comprises the steps: obtaining the aging data of an optical module in real time after an aging start message of the optical module is obtained; analyzing the optical module aging data to obtain optical module aging detection data and a corresponding data type; after classifying the aging detection data of the optical module according to the data type, storing the aging detection data of the optical module into a preset database; and when a detection data viewing message triggered by a client is obtained, obtaining a data query condition from the detection data viewing message, and obtaining corresponding optical module aging detection data from the database according to the data query condition. The method and the device have the effect of improving the efficiency of checking the abnormal optical module when the aging test is carried out on the optical module.

Description

technical field [0001] The invention relates to the technical field of electrical appliance monitoring, in particular to a reliability monitoring method, device, computer equipment and storage medium of an optical module. Background technique [0002] At present, the optical module, whose English name is optical module, is mainly composed of optoelectronic devices, functional circuits and optical interfaces. The optoelectronic devices include two parts: transmitting and receiving. The function of the optical module is photoelectric conversion. The raw electrical signal is processed and then drives a semiconductor laser (LD) or light emitting diode (LED) to emit a modulated light signal. At the receiving end, after the optical signal comes in, it is converted into an electrical signal by the photodetector diode, and the electrical signal is output after the preamplifier. [0003] In the existing aging test of the optical module, if the optical module has an abnormal state du...

AI Technical Summary

Problems solved by technology

[0003] In the existing aging test of the optical module, if the optical module has an abnormal state due to too low voltage or too high current, such as too high optical power or too low current, the optical module does not meet the requirements of the aging test. Continue the test under this condition, so this does not meet the aging requirements. Or, the optical module has a short circuit during the aging process, and the power output is directly turned off, which will affect the aging test of this batch of optical modules.

[0004] In view of the above-mentioned related technologies, the inventor believes that there is a defect that it takes a lot of time to check when the optical module is abnormal during the aging process, which affects the efficiency of the optical module aging test.

Images