High-resolution defect nondestructive testing method based on combination of ultrasonic plane wave imaging and time reversal operator
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2021-12-10
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the technical field of defect non-destructive detection, and relates to a high-resolution defect non-destructive detection method based on the combination of ultrasonic plane wave imaging and time reversal operator. Background technique
[0002] On the basis of not damaging the material properties, it is a very difficult problem to detect and image tiny defects in materials with complex geometric shapes. Especially for nondestructive testing of metal materials, it is an extremely important quality control technology. Taking GH4169 alloy as an example, it is widely used in key components such as aero-engine turbine disks, compressor drums, casings, etc. Even if these key components exist Both microscopic flaws and fatigue damage can lead to catastrophic consequences, so high-precision non-destructive testing is essential. Ultrasonic testing is one of the most widely used testing methods among all non-destructive testing methods...