TEM (Transmission Electron Microscope) three-dimensional reconstruction sample rod capable of carrying nanometer needle tip sample and automatically rotating 360 degrees

A three-dimensional reconstruction and sample rod technology, which is applied to circuits, discharge tubes, electrical components, etc., can solve the problems that the TEM three-dimensional reconstruction sample rod cannot solve, the loss of structural information in the observation area, and the loss of micro-structural information, so as to improve success. rate and resolution limits, elimination of missing wedges, easy sampling effects

Pending Publication Date: 2022-04-08
NANJING UNIV OF SCI & TECH
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Problems solved by technology

Although this type of technology has been developed to atomic resolution, the current general TEM 3D reconstruction technology still has the problem of local information loss (missing wedge) due to the thin sheet-shaped TEM sample itself or the limitation of the distance between the pole pieces of the electron microscope. The specific performance is as follows: (1) The conventional bulk TEM sample is a disc with a diameter of 3 mm, and the observable thin area exists within a few microns around the small hole in the center of the sample, from the edge of the small hole to the edge of the sample, The sample becomes thicker and thicker. Obviously, when the sample is tilted to a higher angle (above 60°), the thin area around the small hole is easily blocked by the surrounding highlands, resulting in the loss of structural information in the observation area; (2) commercial TEM three-dimensional reconstruction of the sample rod usually still needs to rely on the goniometer of the transmission electron microscope to complete the sample tilting. In order to avoid the risk of colliding with the pole shoe during the tilting process of the sample rod, the goniometer is usually limited to ±75°. Tilt angle range is also greatly reduced when the viewing area is not located at the geometric center of the sample holder
According to theory, in order to completely eliminate the missing wedge, the sample needs to be tilted by ±90°. Obviously, all current commercial 3D reconstruction sample holders cannot meet this condition; Influence, when the sample rod is tilted to a high angle, the end design of the sample rod itself will also cause the microstructure information to be lost by the sample rod itself
[0003] In view of the above problems, the current commercial or patent (Folia Biologica, 60 (S1): 66, 2014, Folia Biologica, 60 (S1): 66, 2014) proposed TEM three-dimensional reconstruction sample rod cannot solve the problem

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  • TEM (Transmission Electron Microscope) three-dimensional reconstruction sample rod capable of carrying nanometer needle tip sample and automatically rotating 360 degrees
  • TEM (Transmission Electron Microscope) three-dimensional reconstruction sample rod capable of carrying nanometer needle tip sample and automatically rotating 360 degrees
  • TEM (Transmission Electron Microscope) three-dimensional reconstruction sample rod capable of carrying nanometer needle tip sample and automatically rotating 360 degrees

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Embodiment Construction

[0037] Below in conjunction with accompanying drawing and embodiment the present invention is described in further detail:

[0038] The invention is a TEM three-dimensional reconstructed sample rod capable of carrying a nano-tip sample and autonomously rotating 360°. The nano-tip sample clamping device is located at the front end of the main body of the sample rod. Composed of buckle and spring return device. The nano-tip protective cover is connected to the main body of the sample rod through a fixed pin and a buckle. For convenience during sample loading, the protective cover can be pulled up to avoid interfering with the sample loading process. After the sample is installed, reset the protective cover and fix it with the buckle , it can protect the nano-needle tip from being damaged when the sample rod is pulled out. The nano needle tip is fixed with a special copper tube. When loading the sample, use a special tool to push the locking buckle to the end of the rod, the jaw...

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Abstract

The invention relates to a TEM three-dimensional reconstruction sample rod capable of carrying a nanometer needle tip sample and automatically rotating 360 degrees. The sample rod specifically comprises a sample rod main body, a nano needle tip sample clamping device, a 360-degree rotation control device and a touch screen control system. According to the invention, the clamping mode of the nano needle tip sample is optimized, and the high coaxiality of the nano needle tip sample and the sample rod is ensured; under the control of the servo motor, the sample autorotation completely avoids the defect that the tilt angle of the traditional TEM sample rod is limited by an angle measuring table of an electron microscope, and meanwhile, the danger that the sample rod touches a pole shoe in the tilt process is greatly reduced. The data is collected by rotating the sample by 360 degrees, so that the problem of information loss in the electron tomography process is completely eliminated, and the resolution limit of three-dimensional reconstruction of the transmission electron microscope is greatly improved.

Description

technical field [0001] The invention relates to a TEM three-dimensional reconstructed sample rod capable of carrying a nano needle tip sample and autonomously rotating 360°, belonging to the field of three-dimensional spatial representation of nanomaterial micro-regions. Background technique [0002] Transmission electron microscopy (TEM), as an important means of microstructure characterization, is widely used in the fields of materials science and life science, and is famous for its high resolution. Conventional TEM pictures are two-dimensional projections of material microstructures in positive space or inverted space, and projections often lead to loss of some asymmetric information of microstructures. Therefore, in the research of materials science and life sciences, the development of electronic tomography is in full swing. Scanning 3D reconstruction technology. Although this type of technology has been developed to atomic resolution, the current general TEM 3D recons...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/20H01J37/28
Inventor 刘吉梓张瑞升卢阳光赵磊
Owner NANJING UNIV OF SCI & TECH
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