TEM (Transmission Electron Microscope) three-dimensional reconstruction sample rod capable of carrying nanometer needle tip sample and automatically rotating 360 degrees
A three-dimensional reconstruction and sample rod technology, which is applied to circuits, discharge tubes, electrical components, etc., can solve the problems that the TEM three-dimensional reconstruction sample rod cannot solve, the loss of structural information in the observation area, and the loss of micro-structural information, so as to improve success. rate and resolution limits, elimination of missing wedges, easy sampling effects
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[0037] Below in conjunction with accompanying drawing and embodiment the present invention is described in further detail:
[0038] The invention is a TEM three-dimensional reconstructed sample rod capable of carrying a nano-tip sample and autonomously rotating 360°. The nano-tip sample clamping device is located at the front end of the main body of the sample rod. Composed of buckle and spring return device. The nano-tip protective cover is connected to the main body of the sample rod through a fixed pin and a buckle. For convenience during sample loading, the protective cover can be pulled up to avoid interfering with the sample loading process. After the sample is installed, reset the protective cover and fix it with the buckle , it can protect the nano-needle tip from being damaged when the sample rod is pulled out. The nano needle tip is fixed with a special copper tube. When loading the sample, use a special tool to push the locking buckle to the end of the rod, the jaw...
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