Laser pulse characteristic measuring device and method based on fluorescence modulation sampling
A laser pulse and measurement device technology, applied in the direction of laser monitoring devices, lasers, laser components, etc., can solve the problems of increased operational difficulty and limited wavelength bandwidth of nonlinear crystals, and achieve wide detection wavelength, simple operation, and measurement high precision effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0051] The present invention will be described in detail below through the accompanying drawings and examples.
[0052] like figure 1 As shown, the present invention is a laser pulse characteristic measurement device based on fluorescence modulation sampling, including a laser 1, a first beam splitter 2, a second beam splitter 5, a third beam splitter 3, a first mirror 6, a first beam splitter Two reflecting mirrors 4, delay line 9, wedge pair 10, concave silver mirror 11, fluorescent crystal 12, focusing mirror 13 and CCD14. The fluorescent crystal 12 is one of zinc oxide, diamond, fused silica, magnesium oxide, and single crystal silicon, and other crystals capable of generating fluorescence can also be used, and the fluorescent wavelengths of different materials are different. In this embodiment, the fluorescent crystal is zinc oxide with a thickness of 200 μm, and the generated fluorescence is 390 nm. In this embodiment, the first beam splitter 2, the second beam splitte...
PUM
Property | Measurement | Unit |
---|---|---|
wavelength | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
length | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com