Semiconductor laser polarization test method and test system
A test method and test system technology, which is applied in the field of semiconductor laser polarization test method and test system, can solve the problems of low reliability, inability to determine the effective angle of the collimated optical path, and high test cost, so as to ensure the compression quality and test process Simple and easy to operate, low construction cost
Pending Publication Date: 2022-05-13
XIAN LIXIN PHOTOELECTRIC SCI & TECH
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[0004] The purpose of the present invention is to solve the problems of low reliability, high test cost and inability to determine whether the collimated light path and the polarization beam splitting prism are in an effective angle in the existing test method of polarization degree, thereby providing a semiconductor laser polarization Test method and test system
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[0023] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.
[0024] According to the optical properties of the semiconductor laser, the present invention proposes a polarization test method. By designing a test system with an adjustable relative position between the semiconductor laser and the collimator lens, a better collimated spot is obtained, so that the laser is incident on the polarization beam splitter. The angle between the prisms is less than 4 degrees, so that the accurate polarization degree of the laser can be obtained.
[0025] Semiconductor laser polarization test method provided by the invention specifically comprises the following steps:
[0026] Step 1. Install the sem...
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The invention provides a method and a system for testing polarization of a semiconductor laser, which mainly solve the problems of low reliability, high testing cost and incapability of determining whether a collimation light path and a polarization beam splitter prism are in an effective included angle in the conventional method for testing the polarization degree. The test system comprises a six-dimensional adjusting table, a collimating lens, a polarization beam splitter prism, a scale adjusting plate, a power detection device, a first sliding rail and a second sliding rail. The semiconductor laser is arranged on the six-dimensional adjusting table; the collimating lens, the polarization beam splitter prism, the power detection device and the scale adjusting plate are sequentially arranged on an emergent light path of the semiconductor laser; the collimating lens performs light beam collimation on a fast axis and a slow axis of the semiconductor laser; the polarization beam splitter prism is arranged on the first slide rail; the power detection device is used for acquiring the optical power of the laser beam passing through the collimating lens and the polarization beam splitter prism; the scale adjusting plate is arranged on the second sliding rail.
Description
technical field [0001] The invention belongs to the field of semiconductor lasers, and in particular relates to a semiconductor laser polarization test method and a test system. Background technique [0002] With the development of laser technology, laser has been widely used in various fields. In particular, semiconductor lasers have been widely used in material processing, medical beauty, laser radar, aerospace and other fields due to their small size, high efficiency, easy integration and maintenance-free characteristics. In particular, fiber lasers widely used in the industrial field use semiconductor lasers as pump sources to achieve high-energy output through polarization combining. [0003] In order to ensure that the degree of polarization of the semiconductor laser meets the requirements of use, it is necessary to accurately measure the degree of polarization of the laser. The current test method for the degree of polarization uses more complex optical paths and t...
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Login to View More IPC IPC(8): G01M11/02G01J1/42
CPCG01M11/02G01J1/4257
Inventor 孙翔李青民李波王琛琛任占强李伟金旭
Owner XIAN LIXIN PHOTOELECTRIC SCI & TECH