Method for determining trace elements in high-temperature alloy

Abstract

The invention relates to a method for measuring trace elements in high-temperature alloy, which comprises the following steps: weighing a certain mass of high-temperature alloy trace element standard substance, exciting in a hollow cathode light source, completely releasing trace analysis elements, preparing into a standard substance blank, weighing a certain mass of to-be-measured sample, exciting in a hollow cathode light source, preparing into a sample blank, and measuring the trace elements in the sample blank. The method comprises the following steps: sequentially putting a standard substance blank, a series of standard substances, a sample blank and a sample into a hollow cathode photoelectric spectrometer, exciting according to a set working condition, measuring the strength of each analysis element, and drawing a working curve of the net strength of the standard substance obtained by deducting the strength of the standard substance blank and the element content in the standard substance, and calculating the content of each analysis element in the sample by using the net strength of the sample from which the blank strength of the sample is deducted. The method can realize preparation of a standard substance blank and a sample blank without analysis elements, effectively eliminates spectral interference and background interference of a light source generated by different marks of standard substances and sample matrixes and coexisting elements, realizes accurate determination of trace elements in multi-mark high-temperature alloys, and has the advantages of high sensitivity, simple operation and low cost. And the analysis result is accurate and reliable.

Description

technical field [0001] The invention relates to a method for measuring trace elements in a superalloy, and belongs to the technical field of spectral analysis. Background technique [0002] The content of trace elements has an important influence on the properties of materials, and the trace analysis of materials has become the most eye-catching frontier field of analytical chemistry research, especially steel, superalloy, pure metal, high-purity alloy, electronic devices, ceramics, pharmaceuticals , In food, there are as many as 60 kinds of micro and trace elements that require analysis and control, and the minimum requirement is less than 0.00001%, and there is even a trend of gradually extending to lower content. [0003] Hollow cathode spectrometry is a method for quantitative detection of trace and ultra-trace elements by direct injection of solid samples, with high sensitivity, high accuracy and simple operation. The solid sample does not need to undergo any chemical ...

AI Technical Summary

Problems solved by technology

[0005] Superalloy materials are the most complex materials in chemical composition. There are nearly 30 kinds of matrix elements and coexisting elements. There are spectral line emissions near trace and ultra-trace element analysis lines, and the light source has background emission. Therefore, in trace element analysis When performing spectral line intensity detection at the spectral line, in addition to the signal intensity of the analytical element at the analytical spectral line, the emission intensity of the interference spectral line of the matrix element and coexisting elements at the analytical spectral line and the background intensity emitted by the light source will be detected at the same time , under the sample excitation conditions of hollow cathode spectroscopy, the emission lines of superalloy matrix elements and coexisting elements, and the emission background of the light source all exist objectively and cannot be avoided, which will cause interference to the analysis of trace elements. Interference and background interference are important factors affecting the analysis of trace elements in superalloys, which will seriously affect the sensitivity of hollow cathode spectroscopy in the determination of trace elements in superalloys, resulting in decreased sensitivity, increased detection limits, and poor accuracy