Rapid oscillator oscillation frequency test system and method

Abstract

The invention discloses a rapid oscillator oscillation frequency test system and method, and the system comprises a to-be-tested chip which comprises a to-be-tested oscillator and / or an oscillation frequency correction circuit and is used for generating to-be-tested oscillation output; the overshoot enhancing network is used for converting oscillation output of the chip to be tested into overshoot oscillation with required specific damping; and the tester is used for sampling the output of the oscillator with overshoot by using a high-speed digital channel of the tester, loading a test program to carry out normalization processing on sampled jump data so as to filter redundant sampling information, and calculating to obtain test frequency according to a normalization processing result of the jump data.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a fast oscillator oscillation frequency testing system and method. Background technique [0002] In various modern smart devices, oscillators (OSCs) are indispensable components. With the continuous improvement of circuit integration and design accuracy, more and more oscillators have begun to be integrated into chips, even in one chip. Design 2-3 oscillators with different oscillation frequencies. For example, in order to further reduce the power consumption of smart devices, many devices will enable sleep mode to save energy. The typical way to save energy in sleep mode is to Use a lower frequency oscillator to generate the system clock. Since the system clock is related to the work of the whole system, the reliability of the oscillator that generates the system clock is very high. On the basis of careful design, the oscillator of each chip must be strictly tested ...

AI Technical Summary

Problems solved by technology

[0005] In order to obtain stable, reliable and accurate test results, the number of sampling points for the output waveform in a single test is generally relatively large, such as 50,000 times, which requires a large storage space, and the calculation of the number of failed flips requires reading all the data. A large number of Data not only wastes storage space and even affects the test process due to storage space limitations, but also a lot of data recovery / reading wastes a lot of test time, especially when oscillation frequency correction is required

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